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Product Detail

SYNM6014CLW

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Wafer & Bare DieIndustrialWaferAvailable
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Specifications

Configuration
N
VDS_Max
60 V
RDS(ON)_Max @VGS=10V
13.8 mΩ
RDS(ON)_Typ @VGS=10V
11.5 mΩ
VGS(th)_Typ
1.7 V
Die Size (μm×μm)
1440*990(含划片槽)
Gross Die (8" wafer)
20001
Wafer Thickness (μm)
150±15
VGS_Max
±20 V
RDS(ON)_Typ @VGS=4.5V
14.5 mΩ
RDS(ON)_Max @VGS=4.5V
17.4 mΩ
Ciss_Typ
625 pF
Coss_Typ
191 pF
Crss_Typ
8.4 pF
Qg_Typ
10.5 nC
Qgs_Typ
1.8 nC
Qgd_Typ
2.3 nC
Tj
-55~+150 °C

Online Datasheet

Full text of the synapsechip.com datasheet; refer to the latest revision for updates.

突触半导体 synapsechip.com

SYNM6014CLW

60V N-Channel Power MOSFET

WAFER DATASHEET

Device Symbol — SYNM6014CLW N-channel power MOSFET, D/G/S terminals with body diode

Features

  • VDS = 60 V
  • RDS(ON)_TYP = 11.5 mΩ (VGS = 10 V)
  • RDS(ON)_TYP = 14.5 mΩ (VGS = 4.5 V)

Applications

  • Load Switching
  • Motor Driver
  • High Frequency Switching

Diagram of Chip — SYNM6014CLW die layout, gate/source pad regions with coordinates

Chip Information

Parameter Value
Die Size (include scribe line) 1440 μm × 990 μm
Gate Pad Size 153 μm × 153 μm
Source Pad Size Full Metalized Source
Scribe Line Size 60 μm
Wafer Thickness 150 μm ± 15 μm
Wafer Diameter 200 mm
Polyimide Yes
Front Metal Composition & Thickness AlCu, 5 μm
Back Metal Composition & Thickness Ti/Ni/Ag, 1.4 μm
Gross Die (approximately) 20,001
Recommended Package PDFN5060-8L

Maximum Ratings

(@ TA = 25 °C, unless otherwise specified.)

Parameter Symbol Value Units
Drain–Source Voltage VDS 60 V
Gate–Source Voltage VGS ±20 V
Junction and Storage Temperature Range TJ, TSTG −55 ~ +150 °C

Ordering Information

Orderable Part Number Wafer Description
SYNM6014CLW Sampling Tested Wafer
SYNM6014CLW-C Full CP Tested Wafer

Electrical Characteristics

(@ TJ = 25 °C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Conditions Min. Typ. Max. Units
Drain–Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 μA 60 V
Zero Gate Voltage Drain Current IDSS VDS = 60 V, VGS = 0 V 1.0 μA
Gate–Body Leakage Current IGSS VGS = ±20 V, VDS = 0 V ±100 nA
On Characteristics (1)
Parameter Symbol Test Conditions Min. Typ. Max. Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250 μA 1.2 1.7 2.5 V
Static Drain–Source On-Resistance (1) RDS(ON) VGS = 10 V, ID = 20 A 11.5 13.8
Static Drain–Source On-Resistance (1) RDS(ON) VGS = 4.5 V, ID = 15 A 14.5 17.4
Diode Forward Voltage VSD IS = 2.0 A, VGS = 0 V 0.7 1.2 V

Dynamic Characteristics

Parameter Symbol Test Condition Min. Typ. Max. Units
Input Capacitance Ciss VDS = 30 V, VGS = 0 V, f = 1 MHz 625 pF
Output Capacitance Coss VDS = 30 V, VGS = 0 V, f = 1 MHz 191 pF
Reverse Transfer Capacitance Crss VDS = 30 V, VGS = 0 V, f = 1 MHz 8.4 pF
Gate Resistance Rg VGS = 0 V, VDS = 0 V, f = 1 MHz 1.2 Ω

Gate Charge Characteristics

(Test Condition: VDS = 30 V, ID = 20 A, VGS = 10 V.)

Parameter Symbol Min. Typ. Max. Units
Total Gate Charge Qg 10.5 nC
Gate–Source Charge Qgs 1.8 nC
Gate–Drain Charge Qgd 2.3 nC
Gate Plateau Voltage Vplateau 3.2 V

Drain–Source Diode Characteristics

(Test Condition: IF = 20 A, dI/dt = 100 A/μs, TJ = 25 °C.)

Parameter Symbol Min. Typ. Max. Units
Body Diode Reverse Recovery Time trr 24.0 ns
Body Diode Reverse Recovery Charge Qrr 11.7 nC

Notes

  1. RDS(ON) value is referred by the device assembled in PDFN5060-8L.

Important Notice

Information in this document is provided in connection with 突触半导体 products and is subject to change without notice. Customers are responsible for verifying that the product is suitable for their application; no license to any intellectual property right is granted by this document.


SYNM6014CLW · Rev 1.0 · 2026-07  深圳市突触半导体有限公司 · synapsechip.com  Page 1–2 of 2