SMT6005AHAE product image

Product Detail

SMT6005AHAE

SineSemi 中晶新源Core Authorized Distributor

Wafer & Bare DieWafer

Specifications

Process Technology
SGT
Configuration
N
VDS_Max
60 V
RDS(ON)_Max @VGS=10V
4.2 mΩ
RDS(ON)_Typ @VGS=10V
3.5 mΩ
VGS(th)_Typ
3 V
With ESD
No
Die Size (μm×μm)
2440*1700
Gross Die (8" wafer)
6774
Wafer Thickness (μm)
150±15
VGS_Max
±20 V
Ciss_Typ
1829 pF
Coss_Typ
865 pF
Crss_Typ
30 pF
Qg_Typ
31 nC
Qgs_Typ
7.3 nC
Qgd_Typ
7.7 nC
Tj
175 °C
Manufacturer Remarks
SGT N

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT6005AHAE

60V N-Channel Power MOSFET

Product Summary
  • VDS = 60V
  • RDS(ON), max = 3.5mΩ (VGS = 10V)
Potential Applications
  • Load switching
  • Motor driver
  • High frequency switching
Chip Information
Parameter Value
Die Size (with scribe line) 2440µm × 1700µm
Gate Pad Size 155µm × 155µm
Source Pad Size Full Metalized Source
Scribe Line Width 80µm
Wafer Thickness 150µm ± 15µm
Wafer Diameter 8 inch
Polyimide Yes
Front Metal Composition & Thickness AlCu, 4µm
Back Metal Composition & Thickness Ti/Ni/Ag, 1.3µm
Gross Die (approximately) 6,802
Recommended Package PDFN5060-8L
Maximum Ratings (@ TJ = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 60 V
Gate - Source Voltage VGS ±20 V
Junction Temperature Range TJ -55 ~ +175 °C
Ordering Information
Orderable Part Number Wafer Description
SMT6005AHAE Sampling Tested Wafer
SMT6005AHAE-C Full CP Tested Wafer

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Parameter Symbol Test Conditions Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 60 — — V
Zero Gate Voltage Drain Current IDSS VDS = 60V, VGS = 0V — — 1.0 µA
Gate-Body Leakage Current IGSS VGS = ±20V, VDS = 0V — — ±100 nA
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance (1) RDS(on) VGS = 10V, ID = 20A — 3.5 4.2 mΩ
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V — 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Conditions Min Typ Max Units
Input Capacitance Ciss — 1629 — pF
Output Capacitance Coss VDS = 30V, VGS = 0V, f = 1MHz — 985 — pF
Reverse Transfer Capacitance Crss — 35 — pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz — 1.6 — Ω
Gate Charge Characteristics
Parameter Symbol Test Conditions Min Typ Max Units
Total Gate Charge Qg — 31 — nC
Gate-Source Charge Qgs VDS = 30V, ID = 20A — 7.3 — nC
Gate-Drain Charge Qgd VGS = 10V — 7.7 — nC
Gate Plateau Voltage Vplateau — 4.3 — V
Drain-Source Diode Characteristics
Parameter Symbol Test Conditions Min Typ Max Units
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs — 80 — ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C — 47 — nC

Notes:

  1. RDS(on) value is referred by the device assembled in PDFN5060-8L.