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Product Detail

SCMP65R390BP

SineSemi 中晶新源Core Authorized Distributor

SiC MOSFETsPDFN5060-8L
Download Datasheet

Specifications

Automotive (Y/N)
N
Package
PDFN5060-8L
Configuration
N
Tj
175 °C
VDS_Max
650 V
ID_Max
6.5 A
VGS_Max
-10/+22 V
VGS(th)_Typ
3.2 V
RDS(ON)_Typ @VGS=18V,25°C
390 mΩ
RDS(ON)_Max @VGS=18V,25°C
470 mΩ
RDS(ON)_Typ @VGS=18V,175°C
545 mΩ
EAS_Max
64 mJ
Ciss_Typ
137 pF
Coss_Typ
12 pF
Crss_Typ
2 pF
Qg_Typ
8.1 nC
MPQ
5000 pcs
MOQ
50000 pcs

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SCMP65R390BP

650V N-Channel Silicon Carbide Power MOSFET

Product Summary
VDS RDS(ON), typ ID, max
650 V 390 mΩ @ VGS = 18V 6.5 A

PDFN5060-8L

Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 650 V
Gate - Source Voltage (Absolute maximum) VGSmax -10/+22 V
Gate - Source Voltage (Recommended operating) VGSop -5/+18 V
Continuous Drain Current (VGS = 18V) (1) (TC = 25°C) ID 6.5 A
Continuous Drain Current (VGS = 18V) (1) (TC = 100°C) ID 4.6 A
Pulsed Drain Current (2) IDM 26 A
Single Pulse Avalanche Energy (3) EAS 64 mJ
Power Dissipation (TC = 25°C) PD 48 W
Power Dissipation (TC = 100°C) PD 24 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 40 50 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 2.9 3.2 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 1.0mA 650 V
Zero Gate Voltage Drain Current IDSS VDS = 650V, VGS = 0V 2.0 100 µA
Gate-Source Leakage Current IGSS VGS = +22V, VDS = 0V 200 nA
VGS = -10V, VDS = 0V -200 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 1.0mA, TJ = 25°C 2.1 3.2 4.2 V
VGS = VDS, ID = 1.0mA, TJ = 175°C 2.4 V
Static Drain-Source On-Resistance RDS(on) VGS = 18V, ID = 2.5A, TJ = 25°C 390 470
VGS = 18V, ID = 2.5A, TJ = 175°C 545
VGS = 15V, ID = 2.5A, TJ = 25°C 510
VGS = 15V, ID = 2.5A, TJ = 175°C 590
Diode Forward Voltage VSD VGS = -5.0V, ISD = 2.5A, TJ = 25°C 6.0 V
VGS = -5.0V, ISD = 2.5A, TJ = 175°C 5.4 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss VDS = 400V, VGS = 0V, f = 1MHz 137 pF
Output Capacitance Coss 12 pF
Reverse Transfer Capacitance Crss 2.0 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 62 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Switching Loss Eon VDS = 400V, ID = 2.5A, RG = 10Ω, VGS = -5/18V 11 µJ
Turn-Off Switching Loss Eoff 1.5 µJ
Total Switching Loss Etot 12 µJ
Turn-On Delay Time td(on) VDS = 400V, ID = 2.5A, RG = 10Ω, VGS = -5/18V 7.8 ns
Rise Time tr 14 ns
Turn-Off Delay Time td(off) 12 ns
Fall Time tf 20 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (VGS = 18V) Qg VDS = 400V, ID = 2.5A, VGS = -5/18V 8.1 nC
Gate-Source Charge Qgs 1.5 nC
Gate-Drain Charge Qgd 1.9 nC
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time trr VDS = 400V, VGS = -5.0V, ISD = 2.5A, di/dt = 1000A/µs 5.7 ns
Body Diode Reverse Recovery Charge Qrr 15 nC
Peak Reverse Recovery Current Irrm 4.5 A
Diode Forward Current IS TC = 25°C 6.5 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10µs Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ = 25°C, VDD = 325V, VGS = 10V, L = 10mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.