Specifications
- Process Technology
- SGT
- Configuration
- N
- VDS_Max
- 100 V
- RDS(ON)_Max @VGS=10V
- 8 mΩ
- RDS(ON)_Typ @VGS=10V
- 6.8 mΩ
- VGS(th)_Typ
- 1.7 V
- With ESD
- No
- Die Size (μm×μm)
- 2570*1735
- Gross Die (8" wafer)
- 6277
- Wafer Thickness (μm)
- 150±15
- VGS_Max
- ±20 V
- RDS(ON)_Typ @VGS=4.5V
- 8.8 mΩ
- RDS(ON)_Max @VGS=4.5V
- 10.6 mΩ
- Ciss_Typ
- 1295 pF
- Coss_Typ
- 615 pF
- Crss_Typ
- 14 pF
- Qg_Typ
- 25 nC
- Qgs_Typ
- 3.6 nC
- Qgd_Typ
- 5.4 nC
- Tj
- 175 °C
- Manufacturer Remarks
- SGT N
Not sure how to choose? Read the MOSFET Wafer & Bare Die Selection Guide →
Online Datasheet
Compiled from the manufacturer's datasheet; the official document prevails.
SMT10T08ALAE
100V N-Channel Power MOSFET (Wafer Datasheet)
Product Summary
- VDS = 100V
- RDS(ON), max = 8.8mΩ (VGS = 10V)
- RDS(ON), max = 8.8mΩ (VGS = 4.5V)
Chip Information
| Parameter |
Value |
| Die Size (with scribe line) |
2570µm × 1735µm |
| Gate Pad Size |
155µm × 155µm |
| Source Pad Size |
Full Metalized Source |
| Scribe Line Width |
60µm |
| Wafer Thickness |
150µm ± 15µm |
| Wafer Diameter |
8 inch |
| Passivation |
Yes |
| Front Metal Composition & Thickness |
AlCu 4µm |
| Back Metal Composition & Thickness |
Ti/Ni/Ag, 1.3µm |
| Gross Die (approximately) |
6,319 |
| Recommended Package |
PDFN5060-8L |
Ordering Information
| Orderable Part Number |
Wafer Description |
| SMT10T08ALAE |
Sampling Tested Wafer |
| SMT10T08ALAE-C |
Full CP Tested Wafer |
Maximum Ratings (@ TJ = 25°C, unless otherwise specified.)
| Parameter |
Symbol |
Value |
Units |
| Drain - Source Voltage |
VDS |
100 |
V |
| Gate - Source Voltage |
VGS |
±20 |
V |
| Junction Temperature Range |
TJ |
-55 ~ +175 |
°C |
Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)
| Parameter |
Symbol |
Test Conditions |
Min |
Typ |
Max |
Units |
| Drain-Source Breakdown Voltage |
V(BR)DSS |
VGS = 0V, ID = 250µA |
100 |
— |
— |
V |
| Zero Gate Voltage Drain Current |
IDSS |
VDS = 100V, VGS = 0V |
— |
— |
1.0 |
µA |
| Gate-Body Leakage Current |
IGSS |
VGS = ±20V, VDS = 0V |
— |
— |
±100 |
nA |
| Gate Threshold Voltage |
VGS(th) |
VDS = VGS, ID = 250µA |
1.2 |
1.7 |
2.5 |
V |
| Static Drain-Source On-Resistance (1) |
RDS(ON) |
VGS = 10V, ID = 20A |
— |
6.8 |
8.0 |
mΩ |
|
|
VGS = 4.5V, ID = 15A |
— |
8.8 |
10.6 |
mΩ |
| Diodes Forward Voltage |
VSD |
IS = 2.0A, VGS = 0V |
— |
0.7 |
1.2 |
V |
Dynamic Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Units |
| Input Capacitance |
Ciss |
VDS = 50V, VGS = 0V, f = 1MHz |
— |
1295 |
— |
pF |
| Output Capacitance |
Coss |
|
— |
815 |
— |
pF |
| Reverse Transfer Capacitance |
Crss |
|
— |
14 |
— |
pF |
| Gate Resistance |
Rg |
VGS = 0V, VDS = 0V, f = 1MHz |
— |
1.5 |
— |
Ω |
Gate Charge Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Units |
| Total Gate Charge |
Qg |
VDS = 50V, ID = 20A |
— |
25 |
— |
nC |
| Gate-Source Charge |
Qgs |
VGS = 10V |
— |
3.6 |
— |
nC |
| Gate-Drain Charge |
Qgd |
|
— |
9.4 |
— |
nC |
| Gate Plateau Voltage |
Vplateau |
|
— |
2.8 |
— |
V |
Drain-Source Diode Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Units |
| Body Diode Reverse Recovery Time |
trr |
IS = 20A, di/dt = 100A/µs |
— |
45 |
— |
ns |
| Body Diode Reverse Recovery Charge |
Qrr |
TJ = 25°C |
— |
53 |
— |
nC |
Notes:
- RDS(ON) value is referred by the device assembled in PDFN5060-8L.
