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SMT10T08ALAE

中晶新源 SineSemi核心代理商

晶圆/裸片Wafer

参数规格

工艺
SGT
结构
N
漏源电压 VDS
100 V
导通电阻 RDS(ON)@10V 最大
8 mΩ
导通电阻 RDS(ON)@10V 典型
6.8 mΩ
阈值电压 VGS(th) 典型
1.7 V
With ESD
No
Die Size (μm×μm)
2570*1735
Gross Die (8" wafer)
6277
Wafer Thickness (μm)
150±15
栅源电压 VGS 最大
±20 V
导通电阻 RDS(ON)@4.5V 典型
8.8 mΩ
导通电阻 RDS(ON)@4.5V 最大
10.6 mΩ
输入电容 Ciss 典型
1295 pF
输出电容 Coss 典型
615 pF
反向传输电容 Crss 典型
14 pF
总栅极电荷 Qg 典型
25 nC
Qgs_Typ
3.6 nC
Qgd_Typ
5.4 nC
结温 Tj
175 °C
原厂备注
SGT N

在线规格书

以下内容整理自原厂规格书,实际参数以原厂正式文件为准。

SMT10T08ALAE

100V N-Channel Power MOSFET (Wafer Datasheet)

Product Summary
  • VDS = 100V
  • RDS(ON), max = 8.8mΩ (VGS = 10V)
  • RDS(ON), max = 8.8mΩ (VGS = 4.5V)
Chip Information
Parameter Value
Die Size (with scribe line) 2570µm × 1735µm
Gate Pad Size 155µm × 155µm
Source Pad Size Full Metalized Source
Scribe Line Width 60µm
Wafer Thickness 150µm ± 15µm
Wafer Diameter 8 inch
Passivation Yes
Front Metal Composition & Thickness AlCu 4µm
Back Metal Composition & Thickness Ti/Ni/Ag, 1.3µm
Gross Die (approximately) 6,319
Recommended Package PDFN5060-8L
Ordering Information
Orderable Part Number Wafer Description
SMT10T08ALAE Sampling Tested Wafer
SMT10T08ALAE-C Full CP Tested Wafer
Maximum Ratings (@ TJ = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 100 V
Gate - Source Voltage VGS ±20 V
Junction Temperature Range TJ -55 ~ +175 °C
Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)
Parameter Symbol Test Conditions Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 100 — — V
Zero Gate Voltage Drain Current IDSS VDS = 100V, VGS = 0V — — 1.0 µA
Gate-Body Leakage Current IGSS VGS = ±20V, VDS = 0V — — ±100 nA
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance (1) RDS(ON) VGS = 10V, ID = 20A — 6.8 8.0 mΩ
VGS = 4.5V, ID = 15A — 8.8 10.6 mΩ
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V — 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss VDS = 50V, VGS = 0V, f = 1MHz — 1295 — pF
Output Capacitance Coss — 815 — pF
Reverse Transfer Capacitance Crss — 14 — pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz — 1.5 — Ω
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge Qg VDS = 50V, ID = 20A — 25 — nC
Gate-Source Charge Qgs VGS = 10V — 3.6 — nC
Gate-Drain Charge Qgd — 9.4 — nC
Gate Plateau Voltage Vplateau — 2.8 — V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs — 45 — ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C — 53 — nC

Notes:

  1. RDS(ON) value is referred by the device assembled in PDFN5060-8L.