SMP6003ALPWQ product image

Product Detail

SMP6003ALPWQ

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsAutomotivePDFN5060-8L-W

Specifications

Package
PDFN5060-8L-W
Configuration
P
VDS_Max
-60 V
ID
-167 A
RDS(ON)_Max @VGS=10V
3.5 mΩ
Automotive (Y/N)
Y
VGS(th)_Typ
-1.8 V
RDS(ON)_Typ @VGS=10V
2.7 mΩ
RDS(ON)_Typ @VGS=4.5V
3.7 mΩ
RDS(ON)_Max @VGS=4.5V
5.1 mΩ
VGS_Max
±20 V
Tj
175 °C
EAS_Max
1440 mJ
Ciss_Typ
8760 pF
Coss_Typ
2440 pF
Crss_Typ
127 pF
Qg_Typ
120 nC

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMP6003ALPWQ

-40V P-Channel Enhancement Mode Power MOSFET

Sinesemi Automotive MOSFET — AEC-Q101 Qualified, PPAP Capable, 175°C Operating Temperature

Product Summary
VDS RDS(ON), max ID, max
-60 V 3.5 mΩ @ VGS = -10V -167 A
5.1 mΩ @ VGS = -4.5V

PDFN5060-8L-W

Features
  • P-Channel Enhancement Mode - Logic Level
  • AEC-Q101 Qualified, PPAP Capable
  • 175°C Operating Temperature
  • 100% ∆VDS & UIS & Rg Tested
Application
  • General Automotive Applications
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMP6003ALPWQ PDFN5060-8L-W P6003ALQ 13" Tape&Reel 5,000
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS -60 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = -10V) (1) ID TA = 25°C: -167 A
TA = 100°C: -118 A
Pulsed Drain Current (2) IDM 668 A
Single Pulse Avalanche Energy (3) EAS 1440 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS -40 A
Power Dissipation PD TA = 25°C: 169 W
TA = 100°C: 84 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 30 38 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.68 0.89 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = -250µA -60 V
Zero Gate Voltage Drain Current IDSS VDS = -60V, VGS = 0V -1.0 µA
TJ = 125°C -100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = -250µA -1.2 -1.8 -2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = -10V, ID = -20A 2.7 3.5
VGS = -4.5V, ID = -15A 3.7 5.1
Forward Transconductance gfs VDS = -5.0V, ID = -20A 98 S
Diodes Forward Voltage VSD IS = -2.0A, VGS = 0V -0.7 -1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = -30V, VGS = 0V, f = 1MHz 8760 11388 pF
Output Capacitance Coss 2440 3172 pF
Reverse Transfer Capacitance Crss 127 254 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 6.8 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = -10V, VDS = -30V 5.4 ns
Rise Time tr ID = -20A, RGEN = 3.0Ω 13 ns
Turn-Off Delay Time td(off) 203 ns
Fall Time tf 70 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = -10V) Qg VDS = -30V, ID = -20A 120 156 nC
Total Gate Charge (VGS = -4.5V) Qg 56 73 nC
Gate-Source Charge Qgs VGS = -10V 22 33 nC
Gate-Drain Charge Qgd 18.3 23 nC
Gate Plateau Voltage Vplateau -2.9 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = -20A, di/dt = 100A/µs 70 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 88 nC
Diode Forward Current IS TA = 25°C -167 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse.
  3. Defined by design, not subject to production test. TJ=25°C, VDS=-20V, VGS=-10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.