SMP10T40ALPQ product image

Product Detail

SMP10T40ALPQ

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsAutomotivePDFN5060-8L
Download Datasheet

Specifications

Package
PDFN5060-8L
Configuration
P
VDS_Max
-100 V
ID
-34 A
RDS(ON)_Max @VGS=10V
40 mΩ
Automotive (Y/N)
Y
VGS(th)_Typ
-1.8 V
RDS(ON)_Typ @VGS=10V
30 mΩ
RDS(ON)_Typ @VGS=4.5V
36 mΩ
RDS(ON)_Max @VGS=4.5V
50 mΩ
VGS_Max
±20 V
Tj
175 °C
EAS_Max
176 mJ
Ciss_Typ
1402 pF
Coss_Typ
317 pF
Crss_Typ
14 pF
Qg_Typ
23 nC
ESD
No
MPQ
5000 pcs
MOQ
50000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMP10T40ALPQ package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMP10T40ALPQ

-100V P-Channel Enhancement Mode Power MOSFET

Sinesemi Automotive MOSFET — AEC-Q101 Qualified, PPAP Capable, 175°C Operating Temperature

Product Summary
VDS RDS(ON), max ID, max
-100 V 40 mΩ @ VGS = -10V -34 A
50 mΩ @ VGS = -4.5V

PDFN5060-8L

Features
  • P-Channel Enhancement Mode - Logic Level
  • AEC-Q101 Qualified, PPAP Capable
  • 175°C Operating Temperature
  • 100% UIS and Rg Tested
Application
  • General Automotive Applications
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMP10T40ALPQ PDFN5060-8L P10T40ALQ 13'' Tape&Reel 5,000
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS -100 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = -10V) (1) ID TC = 25°C: -34 A
TC = 100°C: -24 A
Pulsed Drain Current (2) IDM -135 A
Single Pulse Avalanche Energy (3) EAS 176 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS -36 A
Power Dissipation PD TC = 25°C: 94 W
TC = 100°C: 47 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 36 45 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.2 1.6 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = -250µA -100 V
Zero Gate Voltage Drain Current IDSS VDS = -100V, VGS = 0V -1.0 µA
TJ = 125°C -100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = -250µA -1.2 -1.8 -2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = -10V, ID = -15A 30 40
VGS = -4.5V, ID = -10A 36 50
Forward Transconductance gfs VDS = -5.0V, ID = -15A 30 S
Diodes Forward Voltage VSD IS = -2.0A, VGS = 0V -0.7 -1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = -50V, VGS = 0V, f = 1MHz 1402 1823 pF
Output Capacitance Coss 317 412 pF
Reverse Transfer Capacitance Crss 14 28 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 5.4 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = -10V, VDS = -50V 5.3 ns
Rise Time tr ID = -15A, RGEN = 3.0Ω 8.5 ns
Turn-Off Delay Time td(off) 26 ns
Fall Time tf 15 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = -10V) Qg VDS = -50V, ID = -15A 23 30 nC
Total Gate Charge (VGS = -4.5V) Qg 11 14.3 nC
Gate-Source Charge Qgs VGS = -10V 4.9 7.4 nC
Gate-Drain Charge Qgd 4.2 6.3 nC
Gate Plateau Voltage Vplateau -3.7 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = -15A, di/dt = 100A/µs 53 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 103 nC
Diode Forward Current IS TC = 25°C -34 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse.
  3. Defined by design, not subject to production test.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.