SMT8501AHTL product image

Product Detail

SMT8501AHTL

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTOLL
Download Datasheet

Specifications

Package
TOLL
Configuration
N
VDS_Max
85 V
ID
311 A
RDS(ON)_Max @VGS=10V
1.7 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
3 V
RDS(ON)_Typ @VGS=10V
1.4 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
1346 mJ
Ciss_Typ
7461 pF
Coss_Typ
2737 pF
Crss_Typ
103 pF
Qg_Typ
105 nC
ESD
No
MPQ
2000 pcs
MOQ
20000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMT8501AHTL package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT8501AHTL

85V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
85 V 1.7 mΩ @ VGS = 10V 311 A

TOLL

Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 85 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID @ TC = 25°C 311 A
ID @ TC = 100°C 197 A
Pulsed Drain Current (2) IDM 856 A
Single Pulse Avalanche Energy (3) EAS 1346 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 93 A
Power Dissipation PD @ TC = 25°C 278 W
PD @ TC = 100°C 111 W
Junction & Storage Temperature Range TJ, TSTG -55~+150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 25 32 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.34 0.45 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 85 V
VDS = 85V, VGS = 0V 1.0 µA
Zero Gate Voltage Drain Current IDSS TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 80A 1.4 1.7
Forward Transconductance gfs VDS = 5.0V, ID = 20A 61 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss 7461 pF
Output Capacitance Coss VDS = 40V, VGS = 0V, f = 1MHz 2737 pF
Reverse Transfer Capacitance Crss 103 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.6 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Delay Time td(on) 15.7 ns
Rise Time tr VDS = 40V, VGS = 10V 27 ns
Turn-Off Delay Time td(off) ID = 80A, RGEN = 3.0Ω 50 ns
Fall Time tf 26 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (VGS = 10V) Qg 105 nC
Total Gate Charge (VGS = 7.0V) Qg 77 nC
Gate-Source Charge Qgs VDS = 40V, ID = 80A 33 nC
Gate-Drain Charge Qgd 26 nC
Gate Plateau Voltage Vplateau 5.0 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 64 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 113 nC
Diode Forward Current IS TJ = 25°C 311 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10us Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=40V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.