SMT10T01CHTL2 product image

Product Detail

SMT10T01CHTL2

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTOLL
Download Datasheet

Specifications

Package
TOLL
Configuration
N
VDS_Max
100 V
ID
292 A
RDS(ON)_Max @VGS=10V
1.9 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
3 V
RDS(ON)_Typ @VGS=10V
1.6 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
1300 mJ
Ciss_Typ
6899 pF
Coss_Typ
2695 pF
Crss_Typ
57 pF
Qg_Typ
93 nC
ESD
No
MPQ
2000 pcs
MOQ
20000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMT10T01CHTL2 package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT10T01CHTL2

100V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
100 V 1.9 mΩ @ VGS = 10V 292 A

TOLL

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% ΔVDS & UIS & Rg Tested
Applications
  • Motor Drives
  • High-Performance Power Supplies
  • Hard Switching and High Speed Circuit
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT10T01CHTL2 TOLL 10T01CH2 13'' Tape&Reel 2,000
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 100 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TC = 25°C: 292 A
TC = 100°C: 185 A
Pulsed Drain Current (2) IDM 1063 A
Single Pulse Avalanche Energy (3) EAS 1300 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 61 A
Power Dissipation (4) PD TC = 25°C: 291 W
TC = 100°C: 116 W
Junction & Storage Temperature Range TJ, TSTG -55~+150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 25 32 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.33 0.43 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 100 V
Zero Gate Voltage Drain Current IDSS VDS = 100V, VGS = 0V 1.0 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 80A 1.6 1.9
Forward Transconductance gfs VDS = 5.0V, ID = 20A 60 S
Diode Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 50V, VGS = 0V, f = 1MHz 6899 pF
Output Capacitance Coss 2695 pF
Reverse Transfer Capacitance Crss 57 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.5 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 50V 17.1 ns
Rise Time tr ID = 80A, RGEN = 3.0Ω 26 ns
Turn-Off Delay Time td(off) 44 ns
Fall Time tf 28 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 50V, ID = 80A 93 nC
Total Gate Charge (VGS = 70V) Qg VDS = 50V, ID = 80A 68 nC
Gate-Source Charge Qgs 33 nC
Gate-Drain Charge Qgd 19 nC
Gate Plateau Voltage Vplateau 5.1 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 80A, di/dt = 100A/µs 70 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 136 nC
Diode Forward Current IS TC = 25°C 292 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10us Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=50V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.