SMJ60R024BFY product image

Product Detail

SMJ60R024BFY

SineSemi 中晶新源Core Authorized Distributor

HV MOSFETsTO247-3L
Download Datasheet

Specifications

Automotive (Y/N)
N
Package
TO247-3L
Configuration
N
Tj
150 °C
VDS_Max
600 V
ID_Max
80 A
VGS(th)_Typ
4 V
RDS(ON)_Typ @VGS=10V
18.5 mΩ
RDS(ON)_Max @VGS=10V
24 mΩ
VGS_Max
±30 V
EAS_Max
2880 mJ
Ciss_Typ
7212 pF
Coss_Typ
142 pF
Crss_Typ
29 pF
Qg_Typ
221 nC

Package & Schematic

SMJ60R024BFY package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMJ60R024BFY

600V Super Junction N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
600 V 24 mΩ @ VGS = 10V 80 A

TO247-3L

Features
  • Low On-Resistance
  • Fast Switching Capability
  • 100% ∆V/DS & UIS & RG Tested
  • RoHS compliant, HALOGEN FREE
Applications
  • LED Lighting
  • Charger and Adapter
  • PC and Telecom Power
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 3 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMJ60R024BFY TO247-3L 60R024BF Tube 30
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 600 V
Gate - Source Voltage VGS ±30 V
Continuous Drain Current (VGS = 10V) (1) ID TC = 25°C: 80 A
TC = 100°C: 50 A
Pulsed Drain Current (2) IDM 319 A
Single Pulse Avalanche Energy (3) EAS 2880 mJ
Single Pulse Avalanche Current (L = 10.0mH) IAS 16.3 A
Power Dissipation PD TC = 25°C: 379 W
TC = 100°C: 152 W
MOSFET dv/dt Ruggedness, VDS = 0...400V dv/dt 56 V/ns
Reverse Diodes dv/dt, VDS = 0...400V, ISD ≤ ID dv/dt 26 V/ns
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 40 50 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.25 0.33 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 600 V
Zero Gate Voltage Drain Current IDSS VDS = 600V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±30V, VDS = 0V ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 3.0 4.0 5.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 10A 18.5 24
Diodes Forward Voltage VSD IS = 10A, VGS = 0V 0.8 1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 400V, VGS = 0V, f = 250kHz 7212 pF
Output Capacitance Coss 142 pF
Reverse Transfer Capacitance Crss 29 pF
Effective Output Capacitance, Energy Related (8) Co(er) VGS = 0V, VDS = 0...400V, f = 250kHz 188 pF
Effective Output Capacitance, Time Related (9) Co(tr) 1327 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 9.3 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 400V 71 ns
Rise Time tr ID = 20A, RGEN = 3.0Ω 62 ns
Turn-Off Delay Time td(off) 381 ns
Fall Time tf 46 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 400V, ID = 20A, VGS = 10V 221 nC
Total Gate Charge (VGS = 7.0V) Qg 167 nC
Gate-Source Charge Qgs 46 nC
Gate-Drain Charge Qgd 104 nC
Gate Plateau Voltage Vplateau 6.1 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs, TJ = 25°C 258 ns
Body Diode Reverse Recovery Charge Qrr 1.5 µC
Body Diode Reverse Recovery Current IRRM 8.3 A
Diode Forward Current IS TC = 25°C 80 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test. TJ=25°C, VDD=400V, VGS=10V, L=50mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.
  8. Co(er) is a fixed capacitance that gives the same stored energy as Coss while VDS is rising from 0 to 400V.
  9. Co(tr) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 400V.