SMJ65R022CFY product image

Product Detail

SMJ65R022CFY

SineSemi 中晶新源Core Authorized Distributor

HV MOSFETsTO247-3L
Download Datasheet

Specifications

Automotive (Y/N)
N
Package
TO247-3L
Configuration
N
Tj
150 °C
VDS_Max
650 V
ID_Max
95 A
VGS(th)_Typ
4 V
RDS(ON)_Typ @VGS=10V
19 mΩ
RDS(ON)_Max @VGS=10V
22 mΩ
VGS_Max
±30 V
EAS_Max
1200 mJ
Ciss_Typ
8900 pF
Coss_Typ
155 pF
Crss_Typ
10 pF
Qg_Typ
200 nC

Package & Schematic

SMJ65R022CFY package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMJ65R022CFY

650V Super Junction N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
650 V 22 mΩ @ VGS = 10V 95 A

TO247-3L

Features
  • Low On-Resistance
  • Fast Switching Capability
  • 100% ∆V/DS & UIS & RG Tested
  • RoHS compliant, HALOGEN FREE
Applications
  • LED Lighting
  • Charger and Adapter
  • PC and Telecom Power
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 3 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMJ65R022CFY TO247-3L 65R022CF Tube 30
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 650 V
Gate - Source Voltage VGS ±30 V
Continuous Drain Current (VGS = 10V) (1) ID TC = 25°C: 95 A
TC = 100°C: 60 A
Pulsed Drain Current (2) IDM 284 A
Single Pulse Avalanche Energy (3) EAS 1200 mJ
Single Pulse Avalanche Current (L = 10.0mH) IAS 10 A
Power Dissipation PD TC = 25°C: 521 W
TC = 100°C: 208.3 W
MOSFET dv/dt Ruggedness, VDS = 0...400V dv/dt 120 V/ns
Reverse Diodes dv/dt, VDS = 0...400V, ISD ≤ ID dv/dt 70 V/ns
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 35 44 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.17 0.24 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 650 V
Zero Gate Voltage Drain Current IDSS VDS = 650V, VGS = 0V 10.0 µA
TJ = 125°C 1500 µA
Gate-Source Leakage Current IGSS VGS = ±30V, VDS = 0V ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 3.0 4.0 5.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 58.2A 19 22
Diodes Forward Voltage VSD IS = 10A, VGS = 0V 0.90 1.1 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 100V, VGS = 0V, f = 1MHz 8900 pF
Output Capacitance Coss 155 pF
Reverse Transfer Capacitance Crss 10.0 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 2.0 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 400V 39 ns
Rise Time tr ID = 58.2A, RGEN = 27Ω 55 ns
Turn-Off Delay Time td(off) 120 ns
Fall Time tf 40 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 480V, ID = 58.2A, VGS = 10V 200 nC
Total Gate Charge (VGS = 8.0V) Qg 170 nC
Gate-Source Charge Qgs 70 nC
Gate-Drain Charge Qgd 76 nC
Gate Plateau Voltage Vplateau 8.0 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 58.2A, di/dt = 100A/µs, TJ = 25°C 205 ns
Body Diode Reverse Recovery Charge Qrr 1.70 µC
Diode Forward Current IS TC = 25°C 95 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test. TJ=25°C, VDD=400V, VGS=10V, L=50mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.