SMV10N50AHT 产品图

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SMV10N50AHT

中晶新源 SineSemi核心代理商

高压 MOSFET

参数规格

结温 Tj
150 °C
漏源电压 VDS
500 V
漏极电流 ID
10 A
导通电阻 RDS(ON)@10V 典型
550 mΩ
导通电阻 RDS(ON)@10V 最大
750 mΩ
雪崩能量 EAS 最大
710 mJ
输入电容 Ciss 典型
1253 pF
输出电容 Coss 典型
130 pF
反向传输电容 Crss 典型
18 pF
总栅极电荷 Qg 典型
32 nC

在线规格书

以下内容整理自原厂规格书,实际参数以原厂正式文件为准。

SMV10N50AHT

500V N-Channel MOSFET

Lead Free Package and Finish

General Features
  • Proprietary New Planar Technology
  • RDS(on) =0.55 Ω@VGS=10V
  • Low Gate Charge Minimize Switching Loss
  • Fast Recovery Body Diode
BV_DSS RDS(ON), typ ID
500V 0.55Ω 10A
Applications
  • Adaptor Charger
  • SMPS Power Supply
  • LCD Panel Power
Absolute Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Symbol Parameter Value Unit
VDSS Drain-to-Source Voltage (1) 500 V
VGSS Gate-to-Source Voltage ±30 V
ID Continuous Drain Current 10 A
IDM Pulsed Drain Current at VGS=10V (4) 40 A
EAS Single Pulse Avalanche Energy 710 mJ
dv/dt Peak Diode Recovery dv/dt (3) 5.0 V/ns
PD Power Dissipation 140 W
Derating Factor above 25°C 1.12 W/°C
TJ & TSTG Operating and Storage Temperature Range -55 to 150 °C
Thermal Characteristics
Symbol Parameter Value Unit
R_θJC Thermal Resistance, Junction-to-Case 0.89 °C/W
R_θJA Thermal Resistance, Junction-to-Ambient 62 °C/W

Electrical Characteristics

OFF Characteristics (TJ = 25°C, unless otherwise specified.)
Symbol Parameter Min Typ Max Unit Test Conditions
BV_DSS Drain-to-Source Breakdown Voltage 500 — — V VGS=0V, ID=250uA
IDSS Drain-to-Source Leakage Current — — 1 µA VDS=500V, VGS=0V
— — 100 µA VDS=400V, VGS=0V, TJ=125°C
IGSS Gate-to-Source Leakage Current — — +100 nA VGS=+30V, VDS=0V
— — -100 nA VGS=-30V, VDS=0V
ON Characteristics (TJ = 25°C, unless otherwise specified.)
Symbol Parameter Min Typ Max Unit Test Conditions
RDS(on) Static Drain-to-Source On-Resistance — 0.55 0.75 Ω VGS=10V, ID=5A
VGS(th) Gate Threshold Voltage 2.0 — 4.0 V VDS=VGS, ID=250uA
gfs Forward Transconductance (6) — 11 — S VDS=20V, ID=10A
Dynamic Characteristics (Essentially independent of operating temperature)
Symbol Parameter Min Typ Max Unit Test Conditions
Ciss Input Capacitance — 1253 — pF VGS=0V, VDS=25V, f=1.0MHz
Crss Reverse Transfer Capacitance — 18 — pF
Coss Output Capacitance — 130 — pF
Qg Total Gate Charge — 32 — nC VDS=250V, ID=10A, VGS=0 to 10V
Qgs Gate-to-Source Charge — 7.8 — nC
Qgd Gate-to-Drain (Miller) Charge — 12 — nC
Resistive Switching Characteristics (Essentially independent of operating temperature)
Symbol Parameter Min Typ Max Unit Test Conditions
td(ON) Turn-on Delay Time — 21 — ns VDD=250V, ID=10A, VGS= 10V, RG=25 Ω
tRR Rise Time — 33 — ns
td(OFF) Turn-Off Delay Time — 80 — ns
tfall Fall Time — 38 — ns
Source-Drain Body Diode Characteristics (TJ = 25°C, unless otherwise specified.)
Symbol Parameter Min Typ Max Unit Test Conditions
ISD Continuous Source Current (1) — — 10 A Integral PN-diode in MOSFET
ISM Pulsed Source Current (4) — — 40 A
VSD Diode Forward Voltage — — 1.5 V ISD=10A, VGS=0V
trr Reverse recovery time — 340 — ns VGS=0V, Irr=10A, di/dt=100A/µs
Qrr Reverse recovery charge — 1.6 — µC

Notes:

  1. TJ=+25°C to +150°C.
  2. Repetitive rating, pulse width limited by maximum junction temperature.
  3. ISD= 9A di/dt < 100 A/µs, VDD < 80 V(sd), TJ=+150°C.
  4. Pulse width≤80µs, duty cycle≤2%.