SMT6002ALPQ product image

Product Detail

SMT6002ALPQ

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsAutomotivePDFN5060-8L

Specifications

Package
PDFN5060-8L
Configuration
N
VDS_Max
60 V
ID
175 A
RDS(ON)_Max @VGS=10V
2.1 mΩ
Automotive (Y/N)
Y
VGS(th)_Typ
1.7 V
RDS(ON)_Typ @VGS=10V
1.7 mΩ
RDS(ON)_Typ @VGS=4.5V
2.5 mΩ
RDS(ON)_Max @VGS=4.5V
3.1 mΩ
VGS_Max
±20 V
Tj
175 °C
EAS_Max
436 mJ
Ciss_Typ
2816 pF
Coss_Typ
1326 pF
Crss_Typ
77 pF
Qg_Typ
53 nC

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT6002ALPQ

60V N-Channel Power MOSFET

Sinesemi Automotive MOSFET — AEC-Q101 Qualified, Logic Level, 175°C

Product Summary
VDS RDS(ON), max ID, max
60 V 2.1 mΩ @ VGS = 10V 175 A
3.1 mΩ @ VGS = 4.5V

PDFN5060-8L

Features
  • N-Channel Enhancement Mode - Logic Level
  • AEC-Q101 Qualified, PPAP Capable
  • 175°C Operating Temperature
  • 100% UIS and RG Tested
Application
  • General Automotive Applications
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT6002ALPQ PDFN5060-8L 6002ALQ 13" Tape&Reel 5,000
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 60 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID @ TA = 25°C 175 A
ID @ TC = 100°C 123 A
Pulsed Drain Current (2) IDM 698 A
Single Pulse Avalanche Energy (3) EAS 436 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 54 A
Power Dissipation PD @ TA = 25°C 125 W
PD @ TC = 100°C 63 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 35 44 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.9 1.2 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 60 V
VDS = 60V, VGS = 0V 1.0 µA
Zero Gate Voltage Drain Current IDSS TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A 1.7 2.1
VGS = 4.5V, ID = 15A 2.5 3.1
Forward Transconductance gfs VDS = 5.0V, ID = 20A 59 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss 2816 3660 pF
Output Capacitance Coss VDS = 30V, VGS = 0V, f = 1MHz 1326 1723 pF
Reverse Transfer Capacitance Crss 77 154 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.4 Ω
Switching Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Delay Time td(on) 5.0 ns
Rise Time tr VDS = 10V, VGS = 30V 15 ns
Turn-Off Delay Time td(off) ID = 20A, RGEN = 3.0Ω 48 ns
Fall Time tf 23 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (VGS = 10V) Qg 53 79 nC
Total Gate Charge (VGS = 4.5V) Qg VDS = 30V, ID = 25A 27 42 nC
Gate-Source Charge Qgs VGS = N/V 7.8 13 nC
Gate-Drain Charge Qgd 12 23 nC
Gate Plateau Voltage Vplateau 2.9 V
Drain-Source Diode Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 47 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 42 nC
Diode Forward Current IS TJ = 25°C 156 A

Notes:

  1. This current is chip limited, which is calculated based on Rθjc.
  2. This current is calculated on single pulse with 10µs Single Pulse.
  3. Defined by design; not subject to production test. EAS condition: TJ=25°C, VDD=30V, VGS=10V, L=1.0mH.
  4. Device mounted on FR4 substrate PC board with 2oz copper on 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.