SMT20T10BHT product image

Product Detail

SMT20T10BHT

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTO263-3L

Specifications

Package
TO263-3L
VDS_Max
200 V
ID
110 A
RDS(ON)_Max @VGS=10V
10 mΩ
VGS(th)_Typ
3.4 V
RDS(ON)_Typ @VGS=10V
8.3 mΩ
VGS_Max
±20 V
Tj
175 °C
EAS_Max
1440 mJ
Ciss_Typ
2996 pF
Coss_Typ
462 pF
Crss_Typ
13 pF
Qg_Typ
45 nC

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT20T10BHS(T)

200V N-Channel Power MOSFET

Product Summary
V_DS R_DS(ON), max I_D, max Package
200 V 10.0 mΩ @ V_GS = 10V 110 A TO263-3L
200 V 10.3 mΩ @ V_GS = 10V TO220-3L

TO220-3L / TO263-3L

Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT20T10BHS TO220-3L 20T10BH Tube 50
SMT20T10BHT TO263-3L 20T10BH 13" Tape&Reel 1,000
Maximum Ratings (@ T_A = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage V_DS 200 V
Gate - Source Voltage V_GS ±20 V
Continuous Drain Current (V_GS = 10V) ^(1) I_D T_A = 25°C: 110 A
T_A = 100°C: 78 A
Pulsed Drain Current ^(2) I_DM 440 A
Single Pulse Avalanche Energy ^(3) E_AS 1440 mJ
Single Pulse Avalanche Current (L = 0.3mH) I_AS 86 A
Power Dissipation P_D T_A = 25°C: 333 W
T_A = 100°C: 167 W
Junction & Storage Temperature Range T_J, T_STG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient ^(4) R_θJA 25 31 °C/W
Thermal Resistance, Junction-to-Case ^(5) R_θJC 0.35 0.45 °C/W

Electrical Characteristics (@ T_J = 25°C, unless otherwise specified.)

Off Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V_(BR)DSS V_GS = 0V, I_D = 250µA 200 V
Zero Gate Voltage Drain Current I_DSS V_DS = 200V, V_GS = 0V 1.0 µA
T_J = 125°C 100 µA
Gate-Source Leakage Current I_GSS V_GS = ±20V, V_DS = 0V ±100 nA
On Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage V_GS(th) V_DS = V_GS, I_D = 250µA 2.5 3.4 4.5 V
Static Drain-Source On-Resistance R_DS(on) V_GS = 10V, I_D = 20A (TO263-3L) 8.3 10.0
V_GS = 10V, I_D = 20A (TO220-3L) 8.5 10.2
Forward Transconductance g_fs V_DS = 5.0V, I_D = 20A 50 S
Diodes Forward Voltage V_SD I_S = 2.0A, V_GS = 0V 0.7 1.2 V
Dynamic Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance C_iss V_DS = 100V, V_GS = 0V, f = 1MHz 2996 pF
Output Capacitance C_oss 462 pF
Reverse Transfer Capacitance C_rss 13 pF
Gate Resistance R_g V_GS = 0V, V_DS = 0V, f = 1MHz 3.0 Ω
Switching Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time t_d(on) V_GS = 10V, V_DS = 100V 13 ns
Rise Time t_r I_D = 20A, R_GEN = 3.0Ω 29 ns
Turn-Off Delay Time t_d(off) 37 ns
Fall Time t_f 31 ns
Gate Charge Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (V_GS = 10V) Q_g V_DS = 100V, I_D = 20A 45 nC
Total Gate Charge (V_GS = 6.0V) Q_g 30 nC
Gate-Source Charge Q_gs V_GS = 10V 13 nC
Gate-Drain Charge Q_gd 11 nC
Gate Plateau Voltage V_plateau 4.6 V
Drain-Source Diode Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time t_rr I_S = 20A, di/dt = 100A/µs 124 ns
Body Diode Reverse Recovery Charge Q_rr T_J = 25°C 644 nC
Diode Forward Current I_S T_A = 25°C 110 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test. E_AS condition, T_J=25°C, V_DS=100V, V_GS=10V, L=1.5mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to soldering point (on the exposed drain pad).
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.