SMT15T04AHTLQ product image

Product Detail

SMT15T04AHTLQ

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsAutomotiveTOLL
Download Datasheet

Specifications

Package
TOLL
Configuration
N
VDS_Max
150 V
ID
240 A
RDS(ON)_Max @VGS=10V
4.1 mΩ
Automotive (Y/N)
Y
VGS(th)_Typ
3.4 V
RDS(ON)_Typ @VGS=10V
3.4 mΩ
VGS_Max
±20 V
Tj
175 °C
EAS_Max
1796 mJ
Ciss_Typ
6238 pF
Coss_Typ
783 pF
Crss_Typ
23 pF
Qg_Typ
91 nC
ESD
No
MPQ
2000 pcs
MOQ
20000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMT15T04AHTLQ package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT15T04AHTLQ

150V N-Channel Power MOSFET

Sinesemi Automotive MOSFET — AEC-Q101 Qualified, PPAP Capable, 175°C Operating Temperature

Product Summary
VDS RDS(ON), max ID, max
150 V 4.1 mΩ @ VGS = 10V 240 A

TOLL

Features
  • N-Channel Enhancement Mode - Logic Level
  • AEC-Q101 Qualified, PPAP Capable
  • 175°C Operating Temperature
  • 100% ∆VDS & UIS & Rg Tested
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT15T04AHTLQ TOLL 15T04AHQ 13" Tape&Reel 2,000
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 150 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TA = 25°C: 240 A
TA = 100°C: 162 A
Pulsed Drain Current (2) IDM 777 A
Single Pulse Avalanche Energy (3) EAS 1796 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 110 A
Power Dissipation PD TA = 25°C: 500 W
TA = 100°C: 250 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 20 25 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.23 0.30 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 150 V
Zero Gate Voltage Drain Current IDSS VDS = 150V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 2.5 3.4 4.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 80A 3.4 4.1
Forward Transconductance gfs VDS = 5.0V, ID = 20A 58 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 75V, VGS = 0V, f = 1MHz 6238 8109 pF
Output Capacitance Coss 783 1018 pF
Reverse Transfer Capacitance Crss 23 46 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 2.2 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 75V 20 ns
Rise Time tr ID = 80A, RGEN = 3.0Ω 41 ns
Turn-Off Delay Time td(off) 58 ns
Fall Time tf 44 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 75V, ID = 85A 91 118 nC
Total Gate Charge (VGS = 6.0V) Qg 59 77 nC
Gate-Source Charge Qgs VGS = 10V 26 39 nC
Gate-Drain Charge Qgd 21 32 nC
Gate Plateau Voltage Vplateau 4.5 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 80A, di/dt = 100A/µs 103 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 431 nC
Diode Forward Current IS TA = 25°C 240 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Single Pulse.
  3. Defined by design, not subject to production test. EAS condition, TJ=25°C, VDS=75V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.