SMT12T07ALP product image

Product Detail

SMT12T07ALP

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsPDFN5060-8L
Download Datasheet

Specifications

Package
PDFN5060-8L
Configuration
N
VDS_Max
120 V
ID
88 A
RDS(ON)_Max @VGS=10V
6.6 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
1.7 V
RDS(ON)_Typ @VGS=10V
5.5 mΩ
RDS(ON)_Typ @VGS=4.5V
7.2 mΩ
RDS(ON)_Max @VGS=4.5V
9 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
336 mJ
Ciss_Typ
1887 pF
Coss_Typ
928 pF
Crss_Typ
13 pF
Qg_Typ
31 nC
ESD
No
MPQ
5000 pcs
MOQ
50000 pcs
App: HF Power
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMT12T07ALP package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT12T07ALP

120V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
120 V 9.6 mΩ @ VGS = 10V 88 A
9.0 mΩ @ VGS = 4.5V

PDFN5060-8L

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% UIS and Rg tested
  • RoHS compliant, HALOGEN FREE
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT12T07ALP PDFN5060-8L 12T07AL 13" Tape&Reel 5,000
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 120 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TA = 25°C: 88 A
TA = 100°C: 56 A
Pulsed Drain Current (2) IDM 351 A
Single Pulse Avalanche Energy (3) EAS 336 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 45 A
Power Dissipation PD TA = 25°C: 96 W
TA = 100°C: 38 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 35 43 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.0 1.3 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 120 V
Zero Gate Voltage Drain Current IDSS VDS = 120V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 25A 5.5 6.6
VGS = 4.5V, ID = 15A 7.2 9.0
Forward Transconductance gfs VDS = 5.0V, ID = 20A 42 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 60V, VGS = 0V, f = 1MHz 1887 pF
Output Capacitance Coss 928 pF
Reverse Transfer Capacitance Crss 13 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.0 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 60V 5.4 ns
Rise Time tr ID = 20A, RGEN = 3.0Ω 4.5 ns
Turn-Off Delay Time td(off) 25 ns
Fall Time tf 13 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 60V, ID = 25A 31 nC
Total Gate Charge (VGS = 4.5V) Qg 16.2 nC
Gate-Source Charge Qgs VGS = 10V 5.2 nC
Gate-Drain Charge Qgd 7.2 nC
Gate Plateau Voltage Vplateau 3.1 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 57 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 105 nC
Diode Forward Current IS TA = 25°C 88 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test. EAS condition, TJ=25°C, VDS=60V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to soldering point (on the exposed drain pad).
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.