SMT10T01EHTL product image

Product Detail

SMT10T01EHTL

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTOLL
Download Datasheet

Specifications

Package
TOLL
Configuration
N
VDS_Max
100 V
ID
399 A
RDS(ON)_Max @VGS=10V
1.5 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
3 V
RDS(ON)_Typ @VGS=10V
1.2 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
2132 mJ
Ciss_Typ
11930 pF
Coss_Typ
2720 pF
Crss_Typ
71 pF
Qg_Typ
154 nC
ESD
No
MPQ
2000 pcs
MOQ
20000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMT10T01EHTL package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT10T01EHTL

100V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
100 V 1.5 mΩ @ VGS = 10V 399 A

TOLL

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% ΔVDS & UIS & Rg Tested
Applications
  • DC/DC in Telecoms and Industrial
  • Synchronous Rectification in SMPS
  • Hard Switching and High Speed Circuit
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT10T01EHTL TOLL 10T01EH 13'' Tape&Reel 2,000
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 100 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TC = 25°C: 399 A
TC = 100°C: 252 A
Pulsed Drain Current (2) IDM 1527 A
Single Pulse Avalanche Energy (3) EAS 2132 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 78 A
Power Dissipation (4) PD TC = 25°C: 417 W
TC = 100°C: 167 W
Junction & Storage Temperature Range TJ, TSTG -55~+150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 20 25 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.23 0.30 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 100 V
Zero Gate Voltage Drain Current IDSS VDS = 100V, VGS = 0V 1.0 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 80A 1.2 1.5
Forward Transconductance gfs VDS = 5.0V, ID = 20A 72 S
Diode Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 50V, VGS = 0V, f = 1MHz 11930 pF
Output Capacitance Coss 2720 pF
Reverse Transfer Capacitance Crss 71 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.6 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 50V 26 ns
Rise Time tr ID = 80A, RGEN = 3.0Ω 35 ns
Turn-Off Delay Time td(off) 94 ns
Fall Time tf 49 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 50V, ID = 80A 154 nC
Total Gate Charge (VGS = 6.0V) Qg VDS = 50V, ID = 80A 98 nC
Gate-Source Charge Qgs 46 nC
Gate-Drain Charge Qgd 29 nC
Gate Plateau Voltage Vplateau 4.3 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 80A, di/dt = 100A/µs 107 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 229 nC
Diode Forward Current IS TC = 25°C 399 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10us Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=50V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.