SMT10T01AHTT product image

Product Detail

SMT10T01AHTT

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTOLT
Download Datasheet

Specifications

Package
TOLT
Configuration
N
VDS_Max
100 V
ID
385 A
RDS(ON)_Max @VGS=10V
1.35 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
3 V
RDS(ON)_Typ @VGS=10V
1.15 mΩ
VGS_Max
±20 V
Tj
175 °C
EAS_Max
2016 mJ
Ciss_Typ
9660 pF
Coss_Typ
3476 pF
Crss_Typ
48 pF
Qg_Typ
140 nC
ESD
No
MPQ
1300 pcs
MOQ
3900 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMT10T01AHTT package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT10T01AHTT

100V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
100 V 1.35 mΩ @ VGS = 10V 385 A

TOLT

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% ΔVDS & UIS & Rg Tested
Applications
  • Motor Drives
  • Synchronous Rectification in SMPS
  • Hard Switching and High Speed Circuit
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT10T01AHTT TOLT 10T01AH 13'' Tape&Reel 1,800
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 100 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TC = 25°C: 385 A
TC = 100°C: 273 A
Pulsed Drain Current (2) IDM 1316 A
Single Pulse Avalanche Energy (3) EAS 2016 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 85 A
Power Dissipation (4) PD TC = 25°C: 429 W
TC = 100°C: 214 W
Junction & Storage Temperature Range TJ, TSTG -55~+175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 30 40 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.27 0.35 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 100 V
Zero Gate Voltage Drain Current IDSS VDS = 100V, VGS = 0V 1.0 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A 1.15 1.35
Forward Transconductance gfs VDS = 5.0V, ID = 20A 80 S
Diode Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 50V, VGS = 0V, f = 1MHz 9660 pF
Output Capacitance Coss 3476 pF
Reverse Transfer Capacitance Crss 48 pF
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 50V 25 ns
Rise Time tr ID = 20A, RGEN = 3.0Ω 42 ns
Turn-Off Delay Time td(off) 87 ns
Fall Time tf 63 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 50V, ID = 20A 140 nC
Total Gate Charge (VGS = 6.0V) Qg VDS = 50V, ID = 20A 88 nC
Gate-Source Charge Qgs 38 nC
Gate-Drain Charge Qgd 27 nC
Gate Plateau Voltage Vplateau 4.2 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 105 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 394 nC
Diode Forward Current IS TC = 25°C 385 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10μs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=30V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed drain pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.