SMP6050ALU product image

Product Detail

SMP6050ALU

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTO252-3L
Download Datasheet

Specifications

Package
TO252-3L
Configuration
P
VDS_Max
-60 V
ID
-25 A
RDS(ON)_Max @VGS=10V
50 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
-1.8 V
RDS(ON)_Typ @VGS=10V
36 mΩ
RDS(ON)_Typ @VGS=4.5V
48 mΩ
RDS(ON)_Max @VGS=4.5V
65 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
68 mJ
Ciss_Typ
668 pF
Coss_Typ
222 pF
Crss_Typ
12 pF
Qg_Typ
11.8 nC
ESD
No
MPQ
2500 pcs
MOQ
25000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMP6050ALU package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMP6050ALU

-60V P-Channel Enhancement Mode Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
-60 V 50 mΩ @ VGS = -10V -25 A
65 mΩ @ VGS = -4.5V

TO252-3L

Features
  • P-Channel Enhancement Mode - Logic Level
  • Excellent FoM (figure of merit)
  • 100% UIS and Rg Tested
Application
  • Motor drives
  • Load Switch
  • Reverse Polarity Protection
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMP6050ALU TO252-3L P6050AL 13'' Tape&Reel 2,500
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS -60 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = -10V) (1) ID TC = 25°C: -25 A
TC = 100°C: -15.6 A
Pulsed Drain Current (2) IDM -98 A
Single Pulse Avalanche Energy (3) EAS 68 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS -21 A
Power Dissipation PD TC = 25°C: 50 W
TC = 100°C: 20 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 52 65 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.9 2.5 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = -250µA -60 V
Zero Gate Voltage Drain Current IDSS VDS = -60V, VGS = 0V -1.0 µA
TJ = 125°C -100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = -250µA -1.2 -1.8 -2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = -10V, ID = -7.0A 36 50
VGS = -4.5V, ID = -5.0A 48 65
Forward Transconductance gfs VDS = -5.0V, ID = -7.0A 17 S
Diodes Forward Voltage VSD IS = -2.0A, VGS = 0V -0.7 -1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = -30V, VGS = 0V, f = 1MHz 668 pF
Output Capacitance Coss 222 pF
Reverse Transfer Capacitance Crss 12 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 8.6 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = -10V, VDS = -30V 5.5 ns
Rise Time tr ID = -7.0A, RGEN = 3.0Ω 3.6 ns
Turn-Off Delay Time td(off) 21 ns
Fall Time tf 9.1 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = -10V) Qg VDS = -30V, ID = -7.0A 11.8 nC
Total Gate Charge (VGS = -4.5V) Qg 5.3 nC
Gate-Source Charge Qgs VGS = -10V 1.8 nC
Gate-Drain Charge Qgd 1.6 nC
Gate Plateau Voltage Vplateau -2.9 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = -7.0A, di/dt = 100A/µs 25 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 18 nC
Diode Forward Current IS TC = 25°C -25 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse.
  3. Defined by design, not subject to production test.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.