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Product Detail

SMN4007ALU

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTO252-3L

Specifications

Package
TO252-3L
Configuration
N
VDS_Max
40 V
ID
66 A
RDS(ON)_Max @VGS=10V
6.3 mΩ
VGS(th)_Typ
1.6 V
RDS(ON)_Typ @VGS=10V
5 mΩ
RDS(ON)_Typ @VGS=4.5V
6.2 mΩ
RDS(ON)_Max @VGS=4.5V
8.1 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
194 mJ
Ciss_Typ
2501 pF
Coss_Typ
196 pF
Crss_Typ
173 pF
Qg_Typ
50 nC

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMN4007ALU

40V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
40 V 6.3 mΩ @ VGS = 10V 66 A
8.1 mΩ @ VGS = 4.5V

TO252-3L

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% UIS and Rg tested
  • RoHS compliant, HALOGEN FREE
Applications
  • Load switching
  • Motor driver
  • High frequency switching, synchronous rectification
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMN4007ALU TO252-3L N4007AL 13" Tape&Reel 2,500
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 40 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TA = 25°C: 66 A
TA = 100°C: 42 A
Pulsed Drain Current (2) IDM 265 A
Single Pulse Avalanche Energy (3) EAS 194 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 32 A
Power Dissipation PD TA = 25°C: 52 W
TA = 100°C: 21 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 40 50 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.8 2.4 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 40 V
Zero Gate Voltage Drain Current IDSS VDS = 40V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 1.0 1.6 3.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A 5.0 6.3
VGS = 4.5V, ID = 15A 6.2 8.1
Forward Transconductance gfs VDS = 5.0V, ID = 20A 42 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 20V, VGS = 0V, f = 1MHz 2501 pF
Output Capacitance Coss 196 pF
Reverse Transfer Capacitance Crss 173 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.5 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 20V 7.5 ns
Rise Time tr ID = 20A, RGEN = 3.0Ω 14 ns
Turn-Off Delay Time td(off) 48 ns
Fall Time tf 16 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 20V, ID = 25A 50 nC
Total Gate Charge (VGS = 4.5V) Qg 23 nC
Gate-Source Charge Qgs VGS = 10V 5.1 nC
Gate-Drain Charge Qgd 1.7 nC
Gate Plateau Voltage Vplateau 2.4 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 16 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 6.4 nC
Diode Forward Current IS TA = 25°C 66 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test. TJ=25°C, VDS=30V, VGS=10V, L=1mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to soldering point (on the exposed drain pad).
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.