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Product Detail

QH4012AHP

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LV & MV MOSFETsIndustrialPDFN5060-8LAvailable
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Specifications

Package
PDFN5060-8L
Configuration
N
VDS_Max
40 V
ID
212 A
RDS(ON)_Max @VGS=10V
1.4 mΩ
VGS(th)_Typ
3 V
Vth Min
2 V
Vth Max
4 V
RDS(ON)_Typ @VGS=10V
1.2 mΩ
VGS_Max
±20 V
Tj
-55~+150 °C
EAS_Max
436 mJ
Ciss_Typ
3073 pF
Coss_Typ
1515 pF
Crss_Typ
58 pF
Qg_Typ
41 nC
MPQ
5000 pcs

Online Datasheet

Full text of this part's datasheet; refer to the latest revision for updates.

QH4012AHP

40 V N-Channel Power MOSFET

DATASHEET

Features

  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% UIS and Rg tested

Applications

  • Load Switching
  • Motor driver
  • High frequency switching, synchronous rectification

Product Summary

Parameter Value Unit
VDS 40 V
RDS(on),TYP @ VGS = 10 V 1.2
ID @ VGS = 10 V, T = 25 °C 212 A

Ordering Information

Orderable Part Number Package Type Device Marking Form Quantity (pcs)
QH4012AHP PDFN5060-8L QH4012AH 13″ Tape & Reel 5,000

Absolute Maximum Ratings

(@ TC = 25 °C, unless otherwise specified.)

Parameter Symbol Value Unit
Drain – Source Voltage VDS 40 V
Gate – Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10 V) (1), TC = 25 °C ID 212 A
Continuous Drain Current (VGS = 10 V) (1), TC = 100 °C ID 134 A
Pulsed Drain Current (2) IDM 850 A
Single Pulse Avalanche Energy (3) EAS 436 mJ
Single Pulse Avalanche Current (L = 0.1 mH) IAS 56 A
Power Dissipation, TC = 25 °C PD 104 W
Power Dissipation, TC = 100 °C PD 42 W
Junction and Storage Temperature Range TJ, TSTG −55 ~ +150 °C

Thermal Characteristics

Parameter Symbol Typ. Max. Unit
Thermal Resistance, Junction-to-Ambient (4) RθJA 35 45 °C/W
Thermal Resistance, Junction-to-Case (5) RθJC 0.9 1.2 °C/W

Electrical Characteristics

(@ TJ = 25 °C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Conditions Min. Typ. Max. Unit
Drain–Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 μA 40 V
Zero Gate Voltage Drain Current IDSS VDS = 40 V, VGS = 0 V 1.0 μA
Zero Gate Voltage Drain Current IDSS VDS = 40 V, VGS = 0 V, TJ = 125 °C 100 μA
Gate–Source Leakage Current IGSS VGS = ±20 V, VDS = 0 V ±100 nA
On Characteristics (6)
Parameter Symbol Test Conditions Min. Typ. Max. Unit
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250 μA 2.0 3.0 4.0 V
Static Drain–Source On-Resistance RDS(ON) VGS = 10 V, ID = 20 A 1.2 1.4
Forward Transconductance gfs VDS = 5.0 V, ID = 20 A 34 S
Diodes Forward Voltage VSD IS = 2.0 A, VGS = 0 V 0.7 1.2 V

Dynamic Characteristics (7)

Parameter Symbol Test Conditions Min. Typ. Max. Unit
Input Capacitance Ciss VDS = 20 V, VGS = 0 V, f = 1 MHz 3073 pF
Output Capacitance Coss VDS = 20 V, VGS = 0 V, f = 1 MHz 1515 pF
Reverse Transfer Capacitance Crss VDS = 20 V, VGS = 0 V, f = 1 MHz 58 pF
Gate Resistance Rg VGS = 0 V, VDS = 0 V, f = 1 MHz 1.4 Ω

Switching Characteristics (7)

(测试条件:VGS = 10 V, VDS = 20 V, ID = 20 A, RGEN = 3.0 Ω)

Parameter Symbol Min. Typ. Max. Unit
Turn-On Delay Time td(on) 5.6 ns
Rise Time tr 15 ns
Turn-Off Delay Time td(off) 20 ns
Fall Time tf 9.9 ns

Gate Charge Characteristics (7)

(测试条件:VDS = 20 V, ID = 20 A, VGS = 10 V)

Parameter Symbol Min. Typ. Max. Unit
Total Gate Charge (VGS = 10 V) Qg 41 nC
Total Gate Charge (VGS = 6.0 V) Qg 26 nC
Gate–Source Charge Qgs 14 nC
Gate–Drain Charge Qgd 7.5 nC
Gate Plateau Voltage Vplateau 5.0 V

Drain–Source Diode Characteristics (7)

Parameter Symbol Test Conditions Min. Typ. Max. Unit
Body Diode Reverse Recovery Time trr IF = 20 A, dI/dt = 100 A/μs, TJ = 25 °C 46 ns
Body Diode Reverse Recovery Charge Qrr IF = 20 A, dI/dt = 100 A/μs, TJ = 25 °C 50 nC
Diode Forward Current IS TC = 25 °C 132 A

Package Dimensions

(PDFN5060-8L, dimensions in millimeters unless noted.)

Dimension Min. Nom. Max.
A 0.90 1.00 1.10
b 0.20 0.51
c 0.21 0.25 0.34
D 4.90 5.40
D1 4.80 5.15
D2 3.91 4.20
E 5.90 6.50
E1 5.65 5.80 5.95
E2 3.32 3.50 3.63
e 1.27 BSC
H 0.50 0.93
L 0.45 0.91
θ 12°

Dimensioning and tolerancing per ASME Y14.5M, 1994. All dimensions in millimeter (angle in degree). Dimensions D1 and E1 do not include mold flash protrusions or gate burrs.

Notes

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10 μs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test, EAS condition: TJ = 25 °C, VDD = 20 V, VGS = 10 V, L = 1.0 mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to soldering point (on the exposed drain pad).
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.

Important Notice

Information in this document is provided solely for reference in connection with the product identified herein. No license, express or implied, to any intellectual property rights is granted by this document. Specifications are subject to change without notice. The product is not designed for use in life support systems.