SMJ30R019CFTL product image

Product Detail

SMJ30R019CFTL

SineSemi 中晶新源Core Authorized Distributor

HV MOSFETsTOLL
Download Datasheet

Specifications

Automotive (Y/N)
N
Package
TOLL
Configuration
N
Tj
150 °C
VDS_Max
300 V
ID_Max
72 A
VGS(th)_Typ
4 V
RDS(ON)_Typ @VGS=10V
16 mΩ
RDS(ON)_Max @VGS=10V
19 mΩ
VGS_Max
±30 V
EAS_Max
730 mJ
Ciss_Typ
4900 pF
Coss_Typ
3300 pF
Crss_Typ
11 pF
Qg_Typ
100 nC

Package & Schematic

SMJ30R019CFTL package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMJ30R019CFTL

300V Super Junction N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
300 V 19 mΩ @ VGS = 10V 80 A

TOLL

Features
  • Low On-Resistance
  • Fast Switching Capability
  • 100% ∆V/DS & UIS & RG Tested
  • RoHS compliant, HALOGEN FREE
Applications
  • LED Lighting
  • Charger and Adapter
  • PC and Telecom Power
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 3 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMJ30R019CFTL TOLL 30R019CF 13'' Tape&Reel 2,000
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 300 V
Gate - Source Voltage VGS ±30 V
Continuous Drain Current (VGS = 10V) (1) ID TC = 25°C: 80 A
TC = 100°C: 51 A
Pulsed Drain Current (2) IDM 277 A
Single Pulse Avalanche Energy (3) EAS 730 mJ
Single Pulse Avalanche Current (L = 30.0mH) IAS 7.7 A
Power Dissipation PD TC = 25°C: 272 W
TC = 100°C: 109 W
MOSFET dv/dt Ruggedness, VDS = 0...400V dv/dt 50 V/ns
Reverse Diodes dv/dt, VDS = 0...400V, ISD ≤ ID dv/dt 20 V/ns
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 40 50 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 0.33 0.46 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 300 V
Zero Gate Voltage Drain Current IDSS VDS = 300V, VGS = 0V 10.0 µA
TJ = 125°C 150 µA
Gate-Source Leakage Current IGSS VGS = ±30V, VDS = 0V ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 3.0 4.0 5.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 36A 16 19
Diodes Forward Voltage VSD IS = 10A, VGS = 0V 0.9 1.1 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 25V, VGS = 0V, f = 1MHz 4900 pF
Output Capacitance Coss 2800 pF
Reverse Transfer Capacitance Crss 11 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 2.0 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 150V 36 ns
Rise Time tr ID = 36A, RGEN = 5.0Ω 103 ns
Turn-Off Delay Time td(off) 70 ns
Fall Time tf 52 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 150V, ID = 36A, VGS = 10V 100 nC
Total Gate Charge (VGS = 7.0V) Qg 38 nC
Gate-Source Charge Qgs 43 nC
Gate-Drain Charge Qgd 40 nC
Gate Plateau Voltage Vplateau 7.8 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 36A, di/dt = 100A/µs, TJ = 25°C 100 ns
Body Diode Reverse Recovery Charge Qrr 0.50 µC
Body Diode Reverse Recovery Current IRRM 9.0 A
Diode Forward Current IS TC = 25°C 80 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test. TJ=25°C, VDD=400V, VGS=10V, L=50mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.