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BSS84KMQ

中晶新源 SineSemi核心代理商

中低压 MOSFET车规SOT-23

参数规格

封装
SOT-23
结构
P
漏源电压 VDS
-60 V
漏极电流 ID
-0.2 A
导通电阻 RDS(ON)@10V 最大
5900 mΩ
车规 (Y/N)
Y
阈值电压 VGS(th) 典型
-1.6 V
导通电阻 RDS(ON)@10V 典型
3000 mΩ
导通电阻 RDS(ON)@4.5V 典型
3500 mΩ
导通电阻 RDS(ON)@4.5V 最大
8600 mΩ
栅源电压 VGS 最大
±20 V
结温 Tj
150 °C
输入电容 Ciss 典型
29 pF
输出电容 Coss 典型
10 pF
反向传输电容 Crss 典型
5 pF
总栅极电荷 Qg 典型
0.91 nC

在线规格书

以下内容整理自原厂规格书,实际参数以原厂正式文件为准。

BSS84KMQ

-60V P-Channel Enhancement Mode Power MOSFET

Sinesemi Automotive MOSFET — AEC-Qualified, PPAP Capable

Product Summary
VDS RDS(ON), max ID, max
-60 V 5.9 Ω @ VGS = -10V -0.20 A
8.6 Ω @ VGS = -4.5V

SOT-23

Features
  • High Density Cell Design for Low RDS(ON)
  • Voltage Controlled Small Signal Switch
  • Rugged and Reliable
  • High-Saturation Current Capability
  • ESD Protected up to 2.0kV(HBM)
  • AEC-Q101 Qualified, PPAP Capable
Applications
  • General Automotive Applications
Mechanical Data
  • Green Molding Compound
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
BSS84KMQ SOT-23 B84KQ 7" Tape&Reel 3,000
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS -60 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = -10V) (1) ID TA = 25°C: -0.20 A
TA = 70°C: -0.16 A
Pulsed Drain Current (2) IDM -0.82 A
Power Dissipation PD TA = 25°C: 0.48 W
TA = 70°C: 0.31 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (3) R_θJA 200 360 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (5)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = -250µA -60 V
Zero Gate Voltage Drain Current IDSS VDS = -60V, VGS = 0V -1 µA
TJ = 125°C -100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±10 µA
On Characteristics (5)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = -250µA -1.0 -1.6 -2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = -10V, ID = -200mA 3.0 5.9 Ω
VGS = -4.5V, ID = -100mA 3.5 8.6 Ω
Forward Transconductance gfs VDS = -5.0V, ID = -200mA 352 mS
Diode Forward Voltage VSD IS = -200mA, VGS = 0V -0.85 -1.2 V
Dynamic Characteristics (5)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = -30V, VGS = 0V, f = 1MHz 29 pF
Output Capacitance Coss 10.0 pF
Reverse Transfer Capacitance Crss 5.0 pF
Switching Characteristics (5)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VDD = -10V, VGS = -30V 3.7 ns
Rise Time tr ID = -200mA, RGEN = 3.0Ω 2.5 ns
Turn-Off Delay Time td(off) 22 ns
Fall Time tf 18 ns
Gate Charge Characteristics (5)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = -10V) Qg VDS = -30V, ID = -200mA 0.91 nC
Total Gate Charge (VGS = -4.5V) Qg 0.50 nC
Gate-Source Charge Qgs VGS = -5.8V 0.28 nC
Gate-Drain Charge Qgd 0.08 nC
Gate Plateau Voltage Vplateau 2.6 V
Drain-Source Diode Characteristics (5)
Parameter Symbol Test Condition Min Typ Max Unit
Diode Forward Current IS TA = 25°C -0.20 A

Notes:

  1. This current is chip limited, which is calculated based on RθJA.
  2. This current is calculated on single pulse with 10µs Single Pulse.
  3. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  4. Short duration pulse test used to minimize self-heating effect.
  5. Defined by design; not subject to production.