SMT6012ALPD product image

Product Detail

SMT6012ALPD

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsPDFN5060-8L-D
Download Datasheet

Specifications

Package
PDFN5060-8L-D
Configuration
N+N
VDS_Max
60 V
ID
40 A
RDS(ON)_Max @VGS=10V
11.2 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
1.7 V
RDS(ON)_Typ @VGS=10V
9.5 mΩ
RDS(ON)_Typ @VGS=4.5V
12.5 mΩ
RDS(ON)_Max @VGS=4.5V
15.8 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
54 mJ
Ciss_Typ
596 pF
Coss_Typ
349 pF
Crss_Typ
19 pF
Qg_Typ
11.9 nC
ESD
No
MPQ
5000 pcs
MOQ
50000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMT6012ALPD package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT6012ALPD

N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
— V 11.2 mΩ @ VGS = 10V 40 A

PDFN5060-8L-D

Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 60 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID @ TC = 25°C 40 A
ID @ TC = 100°C 25 A
Pulsed Drain Current (2) IDM 157 A
Single Pulse Avalanche Energy (3) EAS 54 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 19 A
Power Dissipation PD @ TC = 25°C 31 W
PD @ TC = 100°C 13 W
Junction & Storage Temperature Range TJ, TSTG -55~+150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 55 68 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 3.1 4.0 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 60 V
VDS = 60V, VGS = 0V 1.0 µA
Zero Gate Voltage Drain Current IDSS TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 4.5V, ID = 15A 12.5 15.8
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A 9.5 11.2
Forward Transconductance gfs VDS = 5.0V, ID = 20A 18 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss 596 pF
Output Capacitance Coss VDS = 30V, VGS = 0V, f = 1MHz 349 pF
Reverse Transfer Capacitance Crss 19 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.3 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Delay Time td(on) 3.3 ns
Rise Time tr VDS = 30V, VGS = 10V 8.2 ns
Turn-Off Delay Time td(off) ID = 20A, RGEN = 3.0Ω 11 ns
Fall Time tf 4.3 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (VGS = 10V) Qg 11.9 nC
Total Gate Charge (VGS = 4.5V) Qg 5.9 nC
Gate-Source Charge Qgs VDS = 30V, ID = 20A 2.0 nC
Gate-Drain Charge Qgd 2.7 nC
Gate Plateau Voltage Vplateau 3.4 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 25 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 16 nC
Diode Forward Current IS TJ = 25°C 40 A

Notes:

  1. This current is chip limited, whiich is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10μs Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=30V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed drain pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.