SMT4005ALPD product image

Product Detail

SMT4005ALPD

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsPDFN5060-8L-D
Download Datasheet

Specifications

Package
PDFN5060-8L-D
Configuration
N+N
VDS_Max
40 V
ID
65 A
RDS(ON)_Max @VGS=10V
5.3 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
1.7 V
RDS(ON)_Typ @VGS=10V
4.4 mΩ
RDS(ON)_Typ @VGS=4.5V
6.5 mΩ
RDS(ON)_Max @VGS=4.5V
8.2 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
102 mJ
Ciss_Typ
994 pF
Coss_Typ
602 pF
Crss_Typ
23 pF
Qg_Typ
14.3 nC
ESD
No
MPQ
5000 pcs
MOQ
50000 pcs
App: HF Power
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMT4005ALPD package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT4005ALPD

—V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
40 V 5.3 mΩ @ VGS = 10V 65 A
8.2 mΩ @ VGS = 4.5V

PDFN5060-8L

Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT4005ALPD PDFN5060-8L-D 4005ALD 13" Tape&Reel 5,000
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 40 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID @ TC = 25°C 65 A
ID @ TC = 100°C 41 A
Pulsed Drain Current (2) IDM 260 A
Single Pulse Avalanche Energy (3) EAS 102 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 27 A
Power Dissipation PD @ TC = 25°C 37 W
PD @ TC = 100°C 15 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 45 56 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 2.6 3.4 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 40 V
Zero Gate Voltage Drain Current IDSS VDS = 40V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A 4.4 5.3
VGS = 4.5V, ID = 15A 6.5 8.2
Forward Transconductance gfs VDS = 5.0V, ID = 20A 25 S
Diode Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss 994 pF
Output Capacitance Coss VDS = 20V, VGS = 0V, f = 1MHz 602 pF
Reverse Transfer Capacitance Crss 23 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 4.1 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) 1.3 ns
Rise Time tr VGS = 10V, VDS = 20V 12 ns
Turn-Off Delay Time td(off) ID = 20A, RGEN = 3.0Ω 17 ns
Fall Time tf 12 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 20V, ID = 20A 14.3 nC
Total Gate Charge (VGS = 4.5V) Qg 6.7 nC
Gate-Source Charge Qgs VGS = 10V 3.1 nC
Gate-Drain Charge Qgd 1.8 nC
Gate Plateau Voltage Vplateau 3.2 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IF = 20A, dI/dt = 100A/s 30 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 11 nC
Diode Forward Current IS TC = 25°C 56 A

Notes:

  1. This current is chip limited, which is calculated based on R_θJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design; not subject to production test.
  4. Device mounted on FR-4 substrate PC board with 2oz copper on 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.