SMT3001BLRB product image

Product Detail

SMT3001BLRB

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsPDFN3333-8L
Download Datasheet

Specifications

Package
PDFN3333-8L
Configuration
N
VDS_Max
30 V
ID
146 A
RDS(ON)_Max @VGS=10V
1.25 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
1.6 V
RDS(ON)_Typ @VGS=10V
1 mΩ
RDS(ON)_Typ @VGS=4.5V
1.6 mΩ
RDS(ON)_Max @VGS=4.5V
2.2 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
336 mJ
Ciss_Typ
2644 pF
Coss_Typ
865 pF
Crss_Typ
55 pF
Qg_Typ
33 nC
ESD
No
MPQ
5000 pcs
MOQ
50000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMT3001BLRB package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT3001BLRB

30V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
30 V 1.25 mΩ @ VGS = 10V 146 A
2.2 mΩ @ VGS = 4.5V

PDFN3333-8L

Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 30 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (1) ID @ TC = 25°C 146 A
ID @ TC = 100°C 92 A
Pulsed Drain Current (2) IDM 583 A
Single Pulse Avalanche Energy (3) EAS 336 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 49 A
Power Dissipation PD @ TC = 25°C 42 W
PD @ TC = 100°C 17 W
Junction & Storage Temperature Range TJ, TSTG -55~+150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 40 50 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 2.3 3.0 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 30 — — V
Zero Gate Voltage Drain Current IDSS VDS = 30V, VGS = 0V — — 1.0 µA
TJ = 125°C — — 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V — — ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.2 1.6 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A — 1.0 1.25 mΩ
VGS = 4.5V, ID = 20A — 1.6 2.2 mΩ
Forward Transconductance gfs VDS = 5.0V, ID = 20A — 45 — S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V — 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 15V, VGS = 0V, f = 1MHz — 2644 — pF
Output Capacitance Coss — 865 — pF
Reverse Transfer Capacitance Crss — 55 — pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz — 2.0 — Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 15V — 5.3 — ns
Rise Time tr ID = 20A, RGEN = 3.0Ω — 4.2 — ns
Turn-Off Delay Time td(off) — 36 — ns
Fall Time tf — 14 — ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 15V, ID = 20A — 33 — nC
Total Gate Charge (VGS = 4.5V) Qg — 14.9 — nC
Gate-Source Charge Qgs VGS = 10V — 8.0 — nC
Gate-Drain Charge Qgd — 3.1 — nC
Gate Plateau Voltage Vplateau — 3.4 — V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs — 34 — ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C — 21 — nC
Diode Forward Current IS TC = 25°C — — 122 A

Notes:

  1. This current is chip limited, which is calculated based on R_θJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed drain pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.