SMT10T20BLRQ product image

Product Detail

SMT10T20BLRQ

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsAutomotivePDFN3333-8L
Download Datasheet

Specifications

Package
PDFN3333-8L
Configuration
N
VDS_Max
100 V
ID
30 A
RDS(ON)_Max @VGS=10V
20 mΩ
Automotive (Y/N)
Y
VGS(th)_Typ
1.8 V
RDS(ON)_Typ @VGS=10V
16.4 mΩ
RDS(ON)_Typ @VGS=4.5V
21 mΩ
RDS(ON)_Max @VGS=4.5V
27 mΩ
VGS_Max
±20 V
Tj
175 °C
EAS_Max
40 mJ
Ciss_Typ
554 pF
Coss_Typ
258 pF
Crss_Typ
8.4 pF
Qg_Typ
10.6 nC
ESD
No
MPQ
5000 pcs
MOQ
50000 pcs
App: HF Power
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMT10T20BLRQ package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT10T20BLRQ

100V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
100 V 20 mΩ @ VGS = 10V 30 A
27 mΩ @ VGS = 4.5V

PDFN3333-8L

Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 100 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TC = 25°C: 30 A
TC = 100°C: 21 A
Pulsed Drain Current (2) IDM 99 A
Single Pulse Avalanche Energy (3) EAS 40 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 16 A
Power Dissipation PD TC = 25°C: 38 W
TC = 100°C: 19 W
Junction & Storage Temperature Range TJ, TSTG -55~+175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 50 63 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 3.0 3.9 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 100 V
Zero Gate Voltage Drain Current IDSS VDS = 100V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.2 1.8 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A 16.4 20
VGS = 4.5V, ID = 15A 21 27
Forward Transconductance gfs VDS = 5.0V, ID = 20A 19 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 50V, VGS = 0V, f = 1MHz 554 pF
Output Capacitance Coss 258 pF
Reverse Transfer Capacitance Crss 8.4 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.0 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 50V 3.2 ns
Rise Time tr ID = 20A, RGEN = 3.0 2.7 ns
Turn-Off Delay Time td(off) 10.5 ns
Fall Time tf 4.0 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 50V, ID = 20A 10.6 nC
Total Gate Charge (VGS = 4.5V) Qg 5.5 nC
Gate-Source Charge Qgs 1.8 nC
Gate-Drain Charge Qgd 2.5 nC
Gate Plateau Voltage Vplateau 3.2 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100 A/µs 34 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 39 nC
Diode Forward Current IS TC = 25°C 30 A

Notes:

  1. This current is chip limited, whiich is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10μs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=50V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to soldering point (on the exposed drain pad).
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.