SMT10T08AHPB product image

Product Detail

SMT10T08AHPB

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsPDFN5060-8L

Specifications

Package
PDFN5060-8L
Configuration
N
VDS_Max
100 V
ID
71 A
RDS(ON)_Max @VGS=10V
8.6 mΩ
VGS(th)_Typ
3 V
RDS(ON)_Typ @VGS=10V
7.1 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
212 mJ
Ciss_Typ
1398 pF
Coss_Typ
310 pF
Crss_Typ
9.1 pF
Qg_Typ
19.8 nC

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT10T08AHPB

100V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
100 V 8.6 mΩ @ VGS = 10V 71 A

PDFN5060-8L

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% ∆VDS & UIS & Rg Tested
  • RoHS compliant, HALOGEN FREE
Applications
  • Ultra-High Performance Power Supplies
  • Motor Driver
  • Hard Switching and High Speed Circuit
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT10T08AHPB PDFN5060-8L 10T08AHB 13" Tape&Reel 6,000
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 100 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID TA = 25°C: 71 A
TA = 100°C: 45 A
Pulsed Drain Current (2) IDM 283 A
Single Pulse Avalanche Energy (3) EAS 212 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 38 A
Power Dissipation PD TA = 25°C: 83 W
TA = 100°C: 33 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 36 48 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.2 1.5 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 100 V
Zero Gate Voltage Drain Current IDSS VDS = 100V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A 7.1 8.6
Forward Transconductance gfs VDS = 5.0V, ID = 20A 29 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 50V, VGS = 0V, f = 1MHz 1398 pF
Output Capacitance Coss 310 pF
Reverse Transfer Capacitance Crss 9.1 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.4 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 50V 5.8 ns
Rise Time tr ID = 20A, RGEN = 3.0Ω 3.4 ns
Turn-Off Delay Time td(off) 11.6 ns
Fall Time tf 4.6 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 50V, ID = 25A 19.8 nC
Total Gate Charge (VGS = 7.0V) Qg 14 nC
Gate-Source Charge Qgs VGS = 10V 5.2 nC
Gate-Drain Charge Qgd 2.8 nC
Gate Plateau Voltage Vplateau 3.8 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 40 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 51 nC
Diode Forward Current IS TA = 25°C 71 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Single Pulse.
  3. Defined by design, not subject to production test. EAS condition, TJ=25°C, VDS=50V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.