SMN3008ALX product image

Product Detail

SMN3008ALX

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsSOP-8L
Download Datasheet

Specifications

Package
SOP-8L
Configuration
N
VDS_Max
30 V
ID
12.3 A
RDS(ON)_Max @VGS=10V
8 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
1.6 V
RDS(ON)_Typ @VGS=10V
6 mΩ
RDS(ON)_Typ @VGS=4.5V
8.3 mΩ
RDS(ON)_Max @VGS=4.5V
15 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
102 mJ
Ciss_Typ
1243 pF
Coss_Typ
174 pF
Crss_Typ
148 pF
Qg_Typ
25 nC
ESD
No
MPQ
4000 pcs
MOQ
40000 pcs
App: Motor Drive
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMN3008ALX package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMN3008ALX

30V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
30 V 8.0 mΩ @ VGS = 10V 12.3 A
15.0 mΩ @ VGS = 4.5V

SOP-8L

Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage VDS 30 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (1) ID @ TA = 25°C 12.3 A
ID @ TA = 100°C 7.8 A
Pulsed Drain Current (2) IDM 49 A
Single Pulse Avalanche Energy (3) EAS 102 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 23 A
Power Dissipation PD @ TA = 25°C 2.0 W
PD @ TA = 100°C 0.8 W
Junction & Storage Temperature Range TJ, TSTG -55~+150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 75 90 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 30 V
Zero Gate Voltage Drain Current IDSS VDS = 30V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.0 1.6 3.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 10A 6.0 8.0
VGS = 4.5V, ID = 8.0A 8.3 15.0
Forward Transconductance gfs VDS = 5.0V, ID = 10A 20 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance Ciss VDS = 15V, VGS = 0V, f = 1MHz 1243 pF
Output Capacitance Coss 174 pF
Reverse Transfer Capacitance Crss 148 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 1.8 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time td(on) VGS = 10V, VDS = 15V 6.6 ns
Rise Time tr ID = 20A, RGEN = 3.0Ω 28 ns
Turn-Off Delay Time td(off) 24 ns
Fall Time tf 26 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (VGS = 10V) Qg VDS = 15V, ID = 20A 25 nC
Total Gate Charge (VGS = 4.5V) Qg 12 nC
Gate-Source Charge Qgs VGS = 10V 3.0 nC
Gate-Drain Charge Qgd 4.9 nC
Gate Plateau Voltage Vplateau 2.8 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs 13 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 3.3 nC
Diode Forward Current IS TA = 25°C 12 A

Notes:

  1. This current is chip limited, which is calculated based on R_θJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed drain pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.