产品详情
SMT20T07AHTL
中晶新源 SineSemi核心代理商
中低压 MOSFETTOLL
参数规格
- 封装
- TOLL
- 漏源电压 VDS
- 200 V
- 漏极电流 ID
- 149 A
- 导通电阻 RDS(ON)@10V 最大
- 7.9 mΩ
- 阈值电压 VGS(th) 典型
- 3.4 V
- 导通电阻 RDS(ON)@10V 典型
- 6.7 mΩ
- 栅源电压 VGS 最大
- ±20 V
- 结温 Tj
- 175 °C
- 雪崩能量 EAS 最大
- 1440 mJ
- 输入电容 Ciss 典型
- 6087 pF
- 输出电容 Coss 典型
- 448 pF
- 反向传输电容 Crss 典型
- 16 pF
- 总栅极电荷 Qg 典型
- 88 nC
在线规格书
以下内容整理自原厂规格书，实际参数以原厂正式文件为准。
SMT20T07AHTL
200V N-Channel Power MOSFET
Product Summary
| V_DS |
R_DS(ON), max |
I_D, max |
| 200 V |
7.9 mΩ @ V_GS = 10V |
149 A |
TOLL
Features
- Low On-Resistance
- Excellent FoM (figure of merit)
- 100% ∆VDS & UIS & Rg Tested
- RoHS compliant, HALOGEN FREE
Ordering Information
| Orderable Part Number |
Package Type |
Device Marking |
Form |
Quantity (pcs) |
| SMT20T07AHTL |
TOLL |
20T07AH |
13" Tape&Reel |
2,000 |
Maximum Ratings (@ T_A = 25°C, unless otherwise specified.)
| Parameter |
Symbol |
Value |
Unit |
| Drain - Source Voltage |
V_DS |
200 |
V |
| Gate - Source Voltage |
V_GS |
±20 |
V |
| Continuous Drain Current (V_GS = 10V) ^(1) |
I_D |
T_A = 25°C: 149 |
A |
|
|
T_A = 100°C: 105 |
A |
| Pulsed Drain Current ^(2) |
I_DM |
596 |
A |
| Single Pulse Avalanche Energy ^(3) |
E_AS |
1440 |
mJ |
| Single Pulse Avalanche Current (L = 0.3mH) |
I_AS |
85 |
A |
| Power Dissipation |
P_D |
T_A = 25°C: 500 |
W |
|
|
T_A = 100°C: 250 |
W |
| Junction & Storage Temperature Range |
T_J, T_STG |
-55 ~ +175 |
°C |
Thermal Characteristics
| Parameter |
Symbol |
Typ |
Max |
Unit |
| Thermal Resistance, Junction-to-Ambient ^(4) |
R_θJA |
20 |
25 |
°C/W |
| Thermal Resistance, Junction-to-Case ^(5) |
R_θJC |
0.23 |
0.30 |
°C/W |
Electrical Characteristics (@ T_J = 25°C, unless otherwise specified.)
Off Characteristics ^(7)
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Drain-Source Breakdown Voltage |
V_(BR)DSS |
V_GS = 0V, I_D = 250µA |
200 |
— |
— |
V |
| Zero Gate Voltage Drain Current |
I_DSS |
V_DS = 200V, V_GS = 0V |
— |
— |
1.0 |
µA |
|
|
T_J = 125°C |
— |
— |
100 |
µA |
| Gate-Source Leakage Current |
I_GSS |
V_GS = ±20V, V_DS = 0V |
— |
— |
±100 |
nA |
On Characteristics ^(7)
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Gate Threshold Voltage |
V_GS(th) |
V_DS = V_GS, I_D = 250µA |
2.5 |
3.4 |
4.5 |
V |
| Static Drain-Source On-Resistance |
R_DS(on) |
V_GS = 10V, I_D = 80A |
— |
6.7 |
7.9 |
mΩ |
| Forward Transconductance |
g_fs |
V_DS = 5.0V, I_D = 20A |
— |
63 |
— |
S |
| Diodes Forward Voltage |
V_SD |
I_S = 2.0A, V_GS = 0V |
— |
0.7 |
1.2 |
V |
Dynamic Characteristics ^(7)
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Input Capacitance |
C_iss |
V_DS = 100V, V_GS = 0V, f = 1MHz |
— |
6087 |
— |
pF |
| Output Capacitance |
C_oss |
|
— |
448 |
— |
pF |
| Reverse Transfer Capacitance |
C_rss |
|
— |
16 |
— |
pF |
| Gate Resistance |
R_g |
V_GS = 0V, V_DS = 0V, f = 1MHz |
— |
2.3 |
— |
Ω |
Switching Characteristics ^(7)
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Turn-On Delay Time |
t_d(on) |
V_GS = 10V, V_DS = 100V |
— |
17 |
— |
ns |
| Rise Time |
t_r |
I_D = 80A, R_GEN = 3.0Ω |
— |
24 |
— |
ns |
| Turn-Off Delay Time |
t_d(off) |
|
— |
60 |
— |
ns |
| Fall Time |
t_f |
|
— |
33 |
— |
ns |
Gate Charge Characteristics ^(7)
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Total Gate Charge (V_GS = 10V) |
Q_g |
V_DS = 100V, I_D = 80A |
— |
88 |
— |
nC |
| Total Gate Charge (V_GS = 7.0V) |
Q_g |
|
— |
66 |
— |
nC |
| Gate-Source Charge |
Q_gs |
V_GS = 10V |
— |
28 |
— |
nC |
| Gate-Drain Charge |
Q_gd |
|
— |
23 |
— |
nC |
| Gate Plateau Voltage |
V_plateau |
|
— |
5.0 |
— |
V |
Drain-Source Diode Characteristics ^(7)
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Body Diode Reverse Recovery Time |
t_rr |
I_S = 80A, di/dt = 100A/µs |
— |
191 |
— |
ns |
| Body Diode Reverse Recovery Charge |
Q_rr |
T_J = 25°C |
— |
689 |
— |
nC |
| Diode Forward Current |
I_S |
T_A = 25°C |
— |
— |
182 |
A |
Notes:
- This current is chip limited, which is calculated based on RθJC.
- This current is calculated on single pulse with 10µs Single Pulse.
- Defined by design, not subject to production test. E_AS condition, T_J=25°C, V_DS=100V, V_GS=10V, L=1.0mH.
- Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
- Thermal resistance from junction to the exposed pad.
- Short duration pulse test used to minimize self-heating effect.
- Defined by design; not subject to production.
