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SMT10T02AHPWQ

中晶新源 SineSemi核心代理商

中低压 MOSFET车规PDFN5060-8L-W

参数规格

封装
PDFN5060-8L-W
结构
N
漏源电压 VDS
100 V
漏极电流 ID
184 A
导通电阻 RDS(ON)@10V 最大
2.4 mΩ
车规 (Y/N)
Y
阈值电压 VGS(th) 典型
3 V
导通电阻 RDS(ON)@10V 典型
1.9 mΩ
栅源电压 VGS 最大
±20 V
结温 Tj
175 °C
雪崩能量 EAS 最大
1000 mJ
输入电容 Ciss 典型
4818 pF
输出电容 Coss 典型
2345 pF
反向传输电容 Crss 典型
50 pF
总栅极电荷 Qg 典型
70 nC
ESD
No
最小包装量
5000 pcs
最小订购量
50000 pcs
应用推荐-马达驱动
Y
应用推荐-高频电源
Y
应用推荐-通用开关
Y

在线规格书

以下内容整理自原厂规格书,实际参数以原厂正式文件为准。

SMT10T02AHPWQ

100V N-Channel Power MOSFET

Sinesemi Automotive MOSFET — AEC-Q101 Qualified, 175°C, Wettable Flank

Product Summary
VDS RDS(ON), max ID, max
100 V 2.4 mΩ @ VGS = 10V 184 A

PDFN5060-8L-W

Features
  • N-Channel Enhancement Mode - Standard Level
  • AEC-Q101 Qualified, PPAP Capable
  • 175°C Operating Temperature
  • 100% ΔVDS & UIS & Rg Tested
  • Wettable Flank for Improved Optical Inspection
Applications
  • General Automotive Applications
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT10T02AHPWQ PDFN5060-8L-W 10T02AHQ 13" Tape&Reel 5,000
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 100 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID @ TC = 25°C 184 A
ID @ TC = 100°C 130 A
Pulsed Drain Current (2) IDM 736 A
Single Pulse Avalanche Energy (3) EAS 1000 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 74 A
Power Dissipation PD @ TC = 25°C 172 W
PD @ TC = 100°C 86 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 29 37 °C/W
Thermal Resistance, Junction-to-Case, Bottom (5) R_θJC 0.67 0.87 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min. Typ. Max. Unit
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 100 V
Zero Gate Voltage Drain Current IDSS VDS = 100V, VGS = 0V 1.0 µA
TJ = 125°C 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min. Typ. Max. Unit
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance RDS(ON) VGS = 10V, ID = 20A 1.9 2.4
Forward Transconductance gfs VDS = 5.0V, ID = 20A 67 S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V 0.7 1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min. Typ. Max. Unit
Input Capacitance Ciss 4818 6263 pF
Output Capacitance Coss VDS = 50V, VGS = 0V, f = 1MHz 2345 3049 pF
Reverse Transfer Capacitance Crss 50 100 pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz 2.3 Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min. Typ. Max. Unit
Turn-On Delay Time td(on) 11 ns
Rise Time tr VGS = 10V, VDS = 50V 20 ns
Turn-Off Delay Time td(off) ID = 20A, RGEN = 3.0Ω 50 ns
Fall Time tf 26 ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min. Typ. Max. Unit
Total Gate Charge (VGS = 10V) Qg 70 91 nC
Total Gate Charge (VGS = 6.0V) Qg VDS = 50V, ID = 20A 45 59 nC
Gate-Source Charge Qgs VGS = 10V 21 32 nC
Gate-Drain Charge Qgd 16.3 25 nC
Gate Plateau Voltage Vplateau 4.8 V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min. Typ. Max. Unit
Body Diode Reverse Recovery Time trr IF = 20A, dI/dt = 100A/µs, 88 ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C 254 nC
Diode Forward Current IS TC = 25°C 184 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10µs Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=50V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.

Typical Electrical and Thermal Characteristics

(曲线图略)

  • Figure 1: Output Characteristics — ID vs. VDS; VGS = 4.5V, 5.0V, 5.5V, 6.0V, 7.0V, 10V
  • Figure 2: Transfer Characteristics — ID vs. VGS; VDS = 3.0V; TJ = 25°C, 175°C
  • Figure 3: On-Resistance vs. Gate-Source Voltage — RDS(on) vs. VGS; ID = 20A; TJ = 25°C, 175°C
  • Figure 4: On-Resistance vs. Drain Current — RDS(on) vs. ID; VGS = 10V
  • Figure 5: On-Resistance vs. Junction Temperature — Normalized RDS(on) vs. TJ; VGS = 10V, ID = 20A
  • Figure 6: Source-Drain Diode Forward Voltage — IS vs. VSD; TJ = 25°C, 175°C; VGS = 10V
  • Figure 7: Gate Threshold Variation vs. Junction Temperature — VGS(th) vs. TJ; ID = 250µA, 1.0mA
  • Figure 8: Gate Charge Characteristics — VGS vs. Qg; ID = 20A
  • Figure 9: Capacitance Characteristics — CT vs. VDS; Ciss, Coss, Crss
  • Figure 10: Power Derating — PD vs. TC
  • Figure 11: Current Derating — ID vs. TC
  • Figure 12: Safe Operating Area — ID vs. VDS; TJ(Max) = 175°C, TC = 25°C; pulse widths 1.0µs, 10µs, 100µs, 1.0ms, 10ms, DC
  • Figure 13: Normalized Maximum Transient Thermal Impedance — r(t) vs. Pulse Width (s); δ = 0.5, 0.2, 0.1, 0.05, 0.02, single pulse; Notes: 1. Duty cycle δ = t₁ / t₂ 2. R_θJC(t) = r(t) × R_θJC

PDFN5060-8L-W Package Outline

Package Dimensions (MILLIMETERS)
DIM. MIN. NOM. MAX.
A 0.900 1.000 1.100
b 0.320 0.420 0.520
c 0.210 0.250 0.340
D 5.050 5.200 5.400
D1 4.950 5.050 5.150
D2 4.000 4.100 4.200
E 6.300 6.400 6.500
E1 5.750 5.850 5.950
E2 3.580 3.680 3.780
e 1.270 BSC
H 0.600 0.700 0.800
L 0.650 0.750 0.850
L1 0.160 0.260 0.360
L2 0.200 0.275 0.350
θ 12°

Notes:

  1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
  2. ALL DIMENSIONS IN MILLIMETER (ANGLE IN DEGREE).
  3. DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD FLASH PROTRUSIONS OR GATE BURRS.
Recommended Soldering Footprint (DIMENSIONS: MILLIMETERS)

(封装焊盘图略)

尺寸标注值:1.270 / 0.520 / 1.000 / 1.260 / 4.200 / 3.775 / 7.100 / 0.355 / 1.175 / 1.150 / 1.270 / 0.520