SMT6005ALPQ 产品图

产品详情

SMT6005ALPQ

中晶新源 SineSemi核心代理商

中低压 MOSFET车规PDFN5060-8L
规格书下载

参数规格

封装
PDFN5060-8L
结构
N
漏源电压 VDS
60 V
漏极电流 ID
109 A
导通电阻 RDS(ON)@10V 最大
4.1 mΩ
车规 (Y/N)
Y
阈值电压 VGS(th) 典型
1.7 V
导通电阻 RDS(ON)@10V 典型
3.4 mΩ
导通电阻 RDS(ON)@4.5V 典型
4.5 mΩ
导通电阻 RDS(ON)@4.5V 最大
5.7 mΩ
栅源电压 VGS 最大
±20 V
结温 Tj
175 °C
雪崩能量 EAS 最大
212 mJ
输入电容 Ciss 典型
1792 pF
输出电容 Coss 典型
901 pF
反向传输电容 Crss 典型
32 pF
总栅极电荷 Qg 典型
33 nC
ESD
No
最小包装量
5000 pcs
最小订购量
50000 pcs
应用推荐-马达驱动
Y
应用推荐-高频电源
T
应用推荐-通用开关
Y

封装与电路符号

SMT6005ALPQ 封装外形、引脚配置与电路符号图
封装外形 · 引脚配置 · 电路符号(源自中晶新源官方 datasheet)

在线规格书

以下内容整理自原厂规格书,实际参数以原厂正式文件为准。

SMT6005ALPQ

60V N-Channel Power MOSFET

Sinesemi Automotive MOSFET — 60 V / 109 A

Product Summary
VDS RDS(ON), typ ID, max
60 V 3.4 mΩ @ VGS = 10V 109 A
4.5 mΩ @ VGS = 4.5V

PDFN5060-8L

Features
  • N-Channel Enhancement Mode - Logic Level
  • AEC-Q101 Qualified, PPAP Capable
  • 175°C Operating Temperature
  • 100% ∆VDS & UIS & Rg Tested
Application
  • General Automotive Applications
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT6005ALPQ PDFN5060-8L 6005ALQ 13" Tape&Reel 5,000
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 60 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID @ TC = 25°C 109 A
ID @ TC = 100°C 77 A
Pulsed Drain Current (2) IDM 410 A
Single Pulse Avalanche Energy (3) EAS 212 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 37 A
Power Dissipation PD @ TC = 25°C 94 W
PD @ TC = 100°C 47 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +175 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 37 46 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.2 1.6 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 60 — — V
Zero Gate Voltage Drain Current IDSS VDS = 60V, VGS = 0V — — 1.0 µA
TJ = 125°C — — 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V — — ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A — 3.4 4.1 mΩ
VGS = 4.5V, ID = 15A — 4.5 5.7 mΩ
Forward Transconductance gfs VDS = 5.0V, ID = 20A — 30 — S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V — 0.7 1.2 V
Dynamic Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss — 1792 — pF
Output Capacitance Coss VDS = 30V, VGS = 0V, f = 1MHz — 901 — pF
Reverse Transfer Capacitance Crss — 32 — pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz — 1.5 — Ω
Switching Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Delay Time td(on) — 5.4 — ns
Rise Time tr VGS = 10V, VDS = 30V — 9.5 — ns
Turn-Off Delay Time td(off) ID = 20A, RGEN = 3.0Ω — 26 — ns
Fall Time tf — 16 — ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (VGS = 10V) Qg — 33 — nC
Total Gate Charge (VGS = 4.5V) Qg VDS = 30V, ID = 20A, — 16.8 — nC
Gate-Source Charge Qgs VGS = 10V — 5.6 — nC
Gate-Drain Charge Qgd — 7.3 — nC
Gate Plateau Voltage Vplateau — 3.2 — V
Drain-Source Diode Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time trr IF = 20A, dI/dt = 100A/µs — 40 — ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C — 48 — nC
Diode Forward Current IS TC = 25°C — — 109 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10µs Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=30V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed drain pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.