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SMT15T15AHU
中晶新源 SineSemi核心代理商
中低压 MOSFETTO252-3L
参数规格
- 封装
- TO252-3L
- 结构
- N
- 漏源电压 VDS
- 150 V
- 漏极电流 ID
- 60 A
- 导通电阻 RDS(ON)@10V 最大
- 13.6 mΩ
- 车规 (Y/N)
- N
- 阈值电压 VGS(th) 典型
- 3.4 V
- 导通电阻 RDS(ON)@10V 典型
- 11.3 mΩ
- 栅源电压 VGS 最大
- ±20 V
- 结温 Tj
- 150 °C
- 雪崩能量 EAS 最大
- 436 mJ
- 输入电容 Ciss 典型
- 2049 pF
- 输出电容 Coss 典型
- 247 pF
- 反向传输电容 Crss 典型
- 12 pF
- 总栅极电荷 Qg 典型
- 28 nC
- ESD
- No
- 最小包装量
- 2500 pcs
- 最小订购量
- 25000 pcs
- 应用推荐-马达驱动
- Y
- 应用推荐-高频电源
- Y
- 应用推荐-通用开关
- Y
不确定怎么选?阅读《中低压 MOSFET 选型指南》 →
封装与电路符号
封装外形 · 引脚配置 · 电路符号(源自中晶新源官方 datasheet)在线规格书
以下内容整理自原厂规格书,实际参数以原厂正式文件为准。
SMT15T15AHU
150V N-Channel Power MOSFET
Product Summary
| VDS |
RDS(ON), max |
ID, max |
| 150 V |
13.6 mΩ @ VGS = 10V |
60 A |
TO252-3L
Maximum Ratings (@ TC = 25°C, unless otherwise specified.)
| Parameter |
Symbol |
Value |
Unit |
| Drain - Source Voltage |
VDS |
150 |
V |
| Gate - Source Voltage |
VGS |
±20 |
V |
| Continuous Drain Current (VGS = 10V) (1) |
ID |
TC = 25°C: 60 |
A |
|
|
TC = 100°C: 38 |
A |
| Pulsed Drain Current (2) |
IDM |
205 |
A |
| Single Pulse Avalanche Energy (3) |
EAS |
436 |
mJ |
| Single Pulse Avalanche Current (L = 0.1mH) |
IAS |
57 |
A |
| Power Dissipation |
PD |
TC = 25°C: 104 |
W |
|
|
TC = 100°C: 42 |
W |
| Junction & Storage Temperature Range |
TJ, TSTG |
-55~+150 |
°C |
Thermal Characteristics
| Parameter |
Symbol |
Typ |
Max |
Unit |
| Thermal Resistance, Junction-to-Ambient (4) |
R_θJA |
28 |
35 |
°C/W |
| Thermal Resistance, Junction-to-Case (5) |
R_θJC |
0.92 |
1.2 |
°C/W |
Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)
Off Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Drain-Source Breakdown Voltage |
V(BR)DSS |
VGS = 0V, ID = 250µA |
150 |
— |
— |
V |
| Zero Gate Voltage Drain Current |
IDSS |
VDS = 150V, VGS = 0V |
— |
— |
1.0 |
µA |
|
|
TJ = 125°C |
— |
— |
100 |
µA |
| Gate-Source Leakage Current |
IGSS |
VGS = ±20V, VDS = 0V |
— |
— |
±100 |
nA |
On Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Gate Threshold Voltage |
VGS(th) |
VGS = VDS, ID = 250µA |
2.5 |
3.4 |
4.5 |
V |
| Static Drain-Source On-Resistance |
RDS(on) |
VGS = 10V, ID = 20A |
— |
11.3 |
13.6 |
mΩ |
| Forward Transconductance |
gfs |
VDS = 5.0V, ID = 20A |
— |
35 |
— |
S |
| Diodes Forward Voltage |
VSD |
IS = 2.0A, VGS = 0V |
— |
0.7 |
1.2 |
V |
Dynamic Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Input Capacitance |
Ciss |
VDS = 75V, VGS = 0V, f = 1MHz |
— |
2049 |
— |
pF |
| Output Capacitance |
Coss |
|
— |
247 |
— |
pF |
| Reverse Transfer Capacitance |
Crss |
|
— |
12 |
— |
pF |
| Gate Resistance |
Rg |
VGS = 0V, VDS = 0V, f = 1MHz |
— |
1.6 |
— |
Ω |
Switching Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Turn-On Delay Time |
td(on) |
VGS = 10V, VDS = 75V |
— |
4.0 |
— |
ns |
| Rise Time |
tr |
ID = 20A, RGEN = 3.0 |
— |
17 |
— |
ns |
| Turn-Off Delay Time |
td(off) |
|
— |
18 |
— |
ns |
| Fall Time |
tf |
|
— |
7.4 |
— |
ns |
Gate Charge Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Total Gate Charge (VGS = 10V) |
Qg |
VDS = 50V, ID = 20A |
— |
28 |
— |
nC |
| Gate-Source Charge |
Qgs |
|
— |
9.4 |
— |
nC |
| Gate-Drain Charge |
Qgd |
|
— |
6.3 |
— |
nC |
| Gate Plateau Voltage |
Vplateau |
|
— |
5.0 |
— |
V |
Drain-Source Diode Characteristics
| Parameter |
Symbol |
Test Condition |
Min |
Typ |
Max |
Unit |
| Body Diode Reverse Recovery Time |
trr |
IS = 20A, di/dt = 100 A/µs |
— |
102 |
— |
ns |
| Body Diode Reverse Recovery Charge |
Qrr |
TJ = 25°C |
— |
207 |
— |
nC |
| Diode Forward Current |
IS |
TC = 25°C |
— |
— |
60 |
A |
Notes:
- This current is chip limited, which is calculated based on Rthjc.
- This current is calculated on single pulse with 10μs Single Pulse.
- Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=75V, VGS=10V, L=1.0mH.
- Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
- Thermal resistance from junction to the exposed pad.
- Short duration pulse test used to minimize self-heating effect.
- Defined by design, not subject to production.