SMJ65R290CNS 产品图

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SMJ65R290CNS

中晶新源 SineSemi核心代理商

高压 MOSFETTO263-3L

参数规格

车规 (Y/N)
N
封装
TO263-3L
结构
N
结温 Tj
150 °C
漏源电压 VDS
650 V
漏极电流 ID
13 A
阈值电压 VGS(th) 典型
3.3 V
导通电阻 RDS(ON)@10V 典型
270 mΩ
导通电阻 RDS(ON)@10V 最大
290 mΩ
栅源电压 VGS 最大
±30 V
雪崩能量 EAS 最大
120 mJ
输入电容 Ciss 典型
750 pF
输出电容 Coss 典型
40 pF
反向传输电容 Crss 典型
1.4 pF
总栅极电荷 Qg 典型
23.5 nC

在线规格书

以下内容整理自原厂规格书,实际参数以原厂正式文件为准。

SMJ65R290CNS

650V Super Junction N-Channel Power MOSFET

Product Summary
V_DS R_DS(ON), max I_D, max
650 V 290 mΩ @ V_GS = 10V 13 A

TO263-3L

Features
  • Low On-Resistance
  • Fast Switching Capability
  • 100% ∆V/DS & UIS & R_G Tested
  • RoHS compliant, HALOGEN FREE
Applications
  • LED Lighting
  • Charger and Adapter
  • PC and Telecom Power
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 3 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMJ65R290CNS TO263-3L 65R290CN Tube 50
Maximum Ratings (@ T_C = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage V_DS 650 V
Gate - Source Voltage V_GS ±30 V
Continuous Drain Current (V_GS = 10V) ^(1) I_D T_C = 25°C: 13 A
T_C = 100°C: 8 A
Pulsed Drain Current ^(2) I_DM 51 A
Single Pulse Avalanche Energy ^(3) E_AS 120 mJ
Single Pulse Avalanche Current (L = 10.0mH) I_AS 3.7 A
Power Dissipation P_D T_C = 25°C: 125 W
T_C = 100°C: 50.0 W
MOSFET dv/dt Ruggedness, V_DS = 0...400V dv/dt 50 V/ns
Reverse Diodes dv/dt, V_DS = 0...400V, I_SD ≤ I_D dv/dt 50 V/ns
Junction & Storage Temperature Range T_J, T_STG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient ^(4) R_θJA 76 97 °C/W
Thermal Resistance, Junction-to-Case ^(5) R_θJC 0.72 1.00 °C/W

Electrical Characteristics (@ T_J = 25°C, unless otherwise specified.)

Off Characteristics ^(6)
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V_(BR)DSS V_GS = 0V, I_D = 250µA 650 V
Zero Gate Voltage Drain Current I_DSS V_DS = 650V, V_GS = 0V 1.0 µA
T_J = 125°C 5 µA
Gate-Source Leakage Current I_GSS V_GS = ±30V, V_DS = 0V ±100 nA
On Characteristics ^(6)
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage V_GS(th) V_DS = V_GS, I_D = 250µA 2.8 3.3 3.8 V
Static Drain-Source On-Resistance R_DS(on) V_GS = 10V, I_D = 10A 270 290
Diodes Forward Voltage V_SD I_S = 10A, V_GS = 0V 0.90 1.1 V
Dynamic Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance C_iss V_DS = 400V, V_GS = 0V, f = 1MHz 750 pF
Output Capacitance C_oss 40 pF
Reverse Transfer Capacitance C_rss 1.4 pF
Gate Resistance R_g V_GS = 0V, V_DS = 0V, f = 1MHz 6.5 Ω
Switching Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time t_d(on) V_GS = 10V, V_DS = 400V 14 ns
Rise Time t_r I_D = 17A, R_GEN = 27Ω 24 ns
Turn-Off Delay Time t_d(off) 97 ns
Fall Time t_f 22 ns
Gate Charge Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (V_GS = 10V) Q_g V_DS = 480V, I_D = 10A, V_GS = 10V 24 nC
Total Gate Charge (V_GS = 8.0V) Q_g 18 nC
Gate-Source Charge Q_gs 5 nC
Gate-Drain Charge Q_gd 10 nC
Gate Plateau Voltage V_plateau 5.5 V
Drain-Source Diode Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time t_rr I_S = 17A, di/dt = 100A/µs, T_J = 25°C 250 ns
Body Diode Reverse Recovery Charge Q_rr 2.9 µC
Diode Forward Current I_S T_C = 25°C 13 A

Notes:

  1. This current is chip limited, which is calculated based on RθJC.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design, not subject to production test. T_J=25°C, V_DD=400V, V_GS=10V, L=50mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design; not subject to production.