SMT6008ALU product image

Product Detail

SMT6008ALU

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTO252-3L
Download Datasheet

Specifications

Package
TO252-3L
Configuration
N
VDS_Max
60 V
ID
73 A
RDS(ON)_Max @VGS=10V
6.6 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
1.7 V
RDS(ON)_Typ @VGS=10V
5.5 mΩ
RDS(ON)_Typ @VGS=4.5V
7.8 mΩ
RDS(ON)_Max @VGS=4.5V
9.8 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
102 mJ
Ciss_Typ
1018 pF
Coss_Typ
475 pF
Crss_Typ
22 pF
Qg_Typ
20 nC
ESD
No
MPQ
2500 pcs
MOQ
25000 pcs
App: HF Power
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMT6008ALU package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT6008ALU

60V N-Channel Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
60 V 8.6 mΩ @ VGS = 10V 73 A
9.8 mΩ @ VGS = 4.5V

TO252-3L

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% UIS & UIS & Rg Tested
Applications
  • Load switching
  • Motor driver
  • High frequency switching, synchronous rectification
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT6008ALU TO252-3L 6008AL 13" Tape&Reel 2,500
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 60 V
Gate - Source Voltage VGS ±20 V
Continuous Drain Current (VGS = 10V) (1) ID @ TA = 25°C 73 A
ID @ TC = 100°C 46 A
Pulsed Drain Current (2) IDM 245 A
Single Pulse Avalanche Energy (3) EAS 102 mJ
Single Pulse Avalanche Current (L = 0.1mH) IAS 25 A
Power Dissipation PD @ TA = 25°C 63 W
PD @ TC = 100°C 25 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 48 60 °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.5 2.0 °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 60 — — V
VDS = 60V, VGS = 0V — — 1.0 µA
Zero Gate Voltage Drain Current IDSS TJ = 125°C — — 100 µA
Gate-Source Leakage Current IGSS VGS = ±20V, VDS = 0V — — ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 20A — 5.5 6.6 mΩ
VGS = 4.5V, ID = 15A — 7.8 9.9 mΩ
Forward Transconductance gfs VDS = 5.0V, ID = 20A — 40 — S
Diodes Forward Voltage VSD IS = 2.0A, VGS = 0V — 0.7 1.2 V
Dynamic Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss — 1018 — pF
Output Capacitance Coss VDS = 30V, VGS = 0V, f = 1MHz — 475 — pF
Reverse Transfer Capacitance Crss — 22 — pF
Gate Resistance Rg VGS = 0V, VDS = 0V, f = 1MHz — 1.7 — Ω
Switching Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Delay Time td(on) — 4.0 — ns
Rise Time tr VDS = 10V, VGS = 30V — 8.8 — ns
Turn-Off Delay Time td(off) ID = 20A, RGEN = 3.0Ω — 17 — ns
Fall Time tf — 9.7 — ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (VGS = 10V) Qg — 20 — nC
Total Gate Charge (VGS = 4.5V) Qg VDS = 30V, ID = 25A — 10.1 — nC
Gate-Source Charge Qgs VGS = N/V — 3.3 — nC
Gate-Drain Charge Qgd — 4.7 — nC
Gate Plateau Voltage Vplateau — 3.3 — V
Drain-Source Diode Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time trr IS = 20A, di/dt = 100A/µs — 30 — ns
Body Diode Reverse Recovery Charge Qrr TJ = 25°C — 25 — nC
Diode Forward Current IS TJ = 25°C — — 61 A

Notes:

  1. This current is chip limited, which is calculated based on Rθjc.
  2. This current is calculated on single pulse with 10µs Pulse.
  3. Defined by design; not subject to production test. EAS condition: TJ=25°C, VDD=30V, VGS=10V, L=1.0mH.
  4. Device mounted on FR4 substrate PC board with 2oz copper on 1inch square cooling area (steady state).
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.