SMT6008ALU product image

Product Detail

SMT6008ALU

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTO252-3L
Download Datasheet

Specifications

Package
TO252-3L
Configuration
N
VDS_Max
60 V
ID
73 A
RDS(ON)_Max @VGS=10V
6.6 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
1.7 V
RDS(ON)_Typ @VGS=10V
5.5 mΩ
RDS(ON)_Typ @VGS=4.5V
7.8 mΩ
RDS(ON)_Max @VGS=4.5V
9.8 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
102 mJ
Ciss_Typ
1018 pF
Coss_Typ
475 pF
Crss_Typ
22 pF
Qg_Typ
20 nC
ESD
No
MPQ
2500 pcs
MOQ
25000 pcs
App: HF Power
Y
App: Battery Protection
Y
App: General Switch
Y

Package & Schematic

SMT6008ALU package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT6008ALU

60V N-Channel Power MOSFET

Product Summary
V_DS R_DS(ON), max I_D, max
60 V 8.6 mΩ @ V_GS = 10V 73 A
9.8 mΩ @ V_GS = 4.5V

TO252-3L

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% UIS & UIS & Rg Tested
Applications
  • Load switching
  • Motor driver
  • High frequency switching, synchronous rectification
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT6008ALU TO252-3L 6008AL 13" Tape&Reel 2,500
Maximum Ratings (@ T_A = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage V_DS 60 V
Gate - Source Voltage V_GS ±20 V
Continuous Drain Current (V_GS = 10V) ^(1) I_D @ T_A = 25°C 73 A
I_D @ T_C = 100°C 46 A
Pulsed Drain Current ^(2) I_DM 245 A
Single Pulse Avalanche Energy ^(3) E_AS 102 mJ
Single Pulse Avalanche Current (L = 0.1mH) I_AS 25 A
Power Dissipation P_D @ T_A = 25°C 63 W
P_D @ T_C = 100°C 25 W
Junction & Storage Temperature Range T_J, T_STG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient ^(4) R_θJA 48 60 °C/W
Thermal Resistance, Junction-to-Case ^(5) R_θJC 1.5 2.0 °C/W

Electrical Characteristics (@ T_J = 25°C, unless otherwise specified.)

Off Characteristics ^(6)
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V_(BR)DSS V_GS = 0V, I_D = 250µA 60 V
V_DS = 60V, V_GS = 0V 1.0 µA
Zero Gate Voltage Drain Current I_DSS T_J = 125°C 100 µA
Gate-Source Leakage Current I_GSS V_GS = ±20V, V_DS = 0V ±100 nA
On Characteristics ^(6)
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage V_GS(th) V_GS = V_DS, I_D = 250µA 1.2 1.7 2.5 V
Static Drain-Source On-Resistance R_DS(on) V_GS = 10V, I_D = 20A 5.5 6.6
V_GS = 4.5V, I_D = 15A 7.8 9.9
Forward Transconductance g_fs V_DS = 5.0V, I_D = 20A 40 S
Diodes Forward Voltage V_SD I_S = 2.0A, V_GS = 0V 0.7 1.2 V
Dynamic Characteristics ^(6)
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance C_iss 1018 pF
Output Capacitance C_oss V_DS = 30V, V_GS = 0V, f = 1MHz 475 pF
Reverse Transfer Capacitance C_rss 22 pF
Gate Resistance R_g V_GS = 0V, V_DS = 0V, f = 1MHz 1.7 Ω
Switching Characteristics ^(6)
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Delay Time t_d(on) 4.0 ns
Rise Time t_r V_DS = 10V, V_GS = 30V 8.8 ns
Turn-Off Delay Time t_d(off) I_D = 20A, R_GEN = 3.0Ω 17 ns
Fall Time t_f 9.7 ns
Gate Charge Characteristics ^(7)
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (V_GS = 10V) Q_g 20 nC
Total Gate Charge (V_GS = 4.5V) Q_g V_DS = 30V, I_D = 25A 10.1 nC
Gate-Source Charge Q_gs V_GS = N/V 3.3 nC
Gate-Drain Charge Q_gd 4.7 nC
Gate Plateau Voltage V_plateau 3.3 V
Drain-Source Diode Characteristics ^(6)
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Reverse Recovery Time t_rr I_S = 20A, di/dt = 100A/µs 30 ns
Body Diode Reverse Recovery Charge Q_rr T_J = 25°C 25 nC
Diode Forward Current I_S T_J = 25°C 61 A

Notes:

  1. This current is chip limited, which is calculated based on Rθjc.
  2. This current is calculated on single pulse with 10µs Pulse.
  3. Defined by design; not subject to production test. E_AS condition: T_J=25°C, V_DD=30V, V_GS=10V, L=1.0mH.
  4. Device mounted on FR4 substrate PC board with 2oz copper on 1inch square cooling area (steady state).
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.