SMT10T01EHT product image

Product Detail

SMT10T01EHT

SineSemi 中晶新源Core Authorized Distributor

LV & MV MOSFETsTO263-3L
Download Datasheet

Specifications

Package
TO263-3L
Configuration
N
VDS_Max
100 V
ID
289 A
RDS(ON)_Max @VGS=10V
1.9 mΩ
Automotive (Y/N)
N
VGS(th)_Typ
3 V
RDS(ON)_Typ @VGS=10V
1.6 mΩ
VGS_Max
±20 V
Tj
150 °C
EAS_Max
2016 mJ
Ciss_Typ
11930 pF
Coss_Typ
2720 pF
Crss_Typ
71 pF
Qg_Typ
154 nC
ESD
No
MPQ
1000 pcs
MOQ
5000 pcs
App: Motor Drive
Y
App: HF Power
Y
App: General Switch
Y

Package & Schematic

SMT10T01EHT package outline, pin configuration and schematic
Package outline · Pin configuration · Schematic (from SineSemi official datasheet)

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMT10T01EHT

100V N-Channel Power MOSFET

Product Summary
V_DS R_DS(ON), max I_D, max
100 V 1.9 mΩ @ V_GS = 10V 289 A

TO220-3L

Features
  • Low On-Resistance
  • Excellent FoM (figure of merit)
  • 100% ΔVDS & UIS & Rg Tested
Applications
  • DC/DC in Telecoms and Inductrial
  • Synchronous Rectification in SMPS
  • Hard Switching and High Speed Circuit
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 1 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMT10T01EHS TO220-3L 10T01EH Tube 50
SMT10T01EHT TO263-3L 10T01EH 13'' Tape&Reel 1,000
Maximum Ratings (@ T_C = 25°C, unless otherwise specified.)
Parameter Symbol Value Unit
Drain - Source Voltage V_DS 100 V
Gate - Source Voltage V_GS ±20 V
Continuous Drain Current (V_GS = 10V) ^(1) I_D T_C = 25°C: 289 A
T_C = 100°C: 183 A
Pulsed Drain Current ^(2) I_DM 1108 A
Single Pulse Avalanche Energy ^(3) E_AS 2016 mJ
Single Pulse Avalanche Current (L = 0.1mH) I_AS 115 A
Power Dissipation ^(4) P_D T_C = 25°C: 278 W
T_C = 100°C: 111 W
Junction & Storage Temperature Range T_J, T_STG -55~+150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient ^(4) R_θJA 25 31 °C/W
Thermal Resistance, Junction-to-Case ^(5) R_θJC 0.35 0.45 °C/W

Electrical Characteristics (@ T_J = 25°C, unless otherwise specified.)

Off Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Drain-Source Breakdown Voltage V_(BR)DSS V_GS = 0V, I_D = 250µA 100 V
Zero Gate Voltage Drain Current I_DSS V_DS = 100V, V_GS = 0V 1.0 µA
Gate-Source Leakage Current I_GSS V_GS = ±20V, V_DS = 0V ±100 nA
On Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Gate Threshold Voltage V_GS(th) V_DS = V_GS, I_D = 250µA 2.0 3.0 4.0 V
Static Drain-Source On-Resistance (TO263-3L) R_DS(on) V_GS = 10V, I_D = 20A 1.6 1.9
Static Drain-Source On-Resistance (TO220-3L) R_DS(on) V_GS = 10V, I_D = 20A 1.9 2.3
Forward Transconductance g_fs V_DS = 5.0V, I_D = 20A 67 S
Diode Forward Voltage V_SD I_S = 2.0A, V_GS = 0V 0.7 1.2 V
Dynamic Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Input Capacitance C_iss V_DS = 50V, V_GS = 0V, f = 1MHz 11930 pF
Output Capacitance C_oss 2720 pF
Reverse Transfer Capacitance C_rss 71 pF
Gate Resistance R_g V_GS = 0V, V_DS = 0V, f = 1MHz 1.6 Ω
Switching Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Turn-On Delay Time t_d(on) V_GS = 10V, V_DS = 50V 26 ns
Rise Time t_r I_D = 20A, R_GEN = 3.0Ω 35 ns
Turn-Off Delay Time t_d(off) 94 ns
Fall Time t_f 49 ns
Gate Charge Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Total Gate Charge (V_GS = 10V) Q_g V_DS = 50V, I_D = 20A 154 nC
Total Gate Charge (V_GS = 6.0V) Q_g V_DS = 50V, I_D = 20A 98 nC
Gate-Source Charge Q_gs 46 nC
Gate-Drain Charge Q_gd 29 nC
Gate Plateau Voltage V_plateau 4.3 V
Drain-Source Diode Characteristics
Parameter Symbol Test Condition Min Typ Max Unit
Body Diode Reverse Recovery Time t_rr I_S = 20A, di/dt = 100A/µs 107 ns
Body Diode Reverse Recovery Charge Q_rr T_J = 25°C 229 nC
Diode Forward Current I_S T_C = 25°C 204 A

Notes:

  1. This current is chip limited, which is calculated based on Rthjc.
  2. This current is calculated on single pulse with 10us Single Pulse.
  3. Defined by design, not subject to production test, EAS condition: TJ=25°C, VDD=50V, VGS=10V, L=1.0mH.
  4. Device mounted on FR-4 substrate PC board with 2oz copper in 1inch square cooling area.
  5. Thermal resistance from junction to the exposed pad.
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.