SMV09N50WFU product image

Product Detail

SMV09N50WFU

SineSemi 中晶新源Core Authorized Distributor

HV MOSFETs

Specifications

Tj
150 °C
VDS_Max
500 V
ID_Max
9 A
RDS(ON)_Typ @VGS=10V
680 mΩ
RDS(ON)_Max @VGS=10V
800 mΩ
VGS_Max
±30 V
EAS_Max
408 mJ
Ciss_Typ
1135 pF
Coss_Typ
110 pF
Crss_Typ
12 pF
Qg_Typ
23 nC

Online Datasheet

Compiled from the manufacturer's datasheet; the official document prevails.

SMV09N50WFU

500V 9A 0.68Ω N-ch Power MOSFET

Product Summary
VDS RDS(ON), max ID, max
500 V 0.68 Ω @ VGS = 10V 9.0 A

TO252-3L

Features
  • Typ RDS(on) 0.68Ω@VGS=10V
  • 100% avalanche tested
  • RoHS Compliant
Applications
  • SMPS
  • Charger
  • DC-DC
Mechanical Data
  • Green Molding Compound
  • Moisture Sensitivity: Level 3 per J-STD-020
  • UL Flammability Classification Rating 94V-0
Ordering Information
Orderable Part Number Package Type Device Marking Form Quantity (pcs)
SMV09N50AFU TO252-3L 09N50AF 13" Tape&Reel 2,500
Maximum Ratings (@ TA = 25°C, unless otherwise specified.)
Parameter Symbol Value Units
Drain - Source Voltage VDS 500 V
Gate - Source Voltage VGS ±30 V
Continuous Drain Current (VGS = 10V) (1) ID @ TA = 25°C 9.0 A
Pulsed Drain Current (2) IDM 36 A
Single Pulse Avalanche Energy (3) EAS 408 mJ
Power Dissipation PD @ TA = 25°C 104 W
Junction & Storage Temperature Range TJ, TSTG -55 ~ +150 °C
Thermal Characteristics
Parameter Symbol Typ Max Unit
Thermal Resistance, Junction-to-Ambient (4) R_θJA 62 — °C/W
Thermal Resistance, Junction-to-Case (5) R_θJC 1.2 — °C/W

Electrical Characteristics (@ TJ = 25°C, unless otherwise specified.)

Off Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 250µA 500 — — V
Drain-Source Leakage Current IDSS VDS = 500, VGS = 0V — — 1.0 µA
VDS = 400, VGS = 0V — — 100 µA
Gate-Source Leakage Current IGSS VGS = ±30V, VDS = 0V — — ±100 nA
On Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Gate Threshold Voltage VGS(th) VGS = VDS, ID = 250µA 2.0 — 4.0 V
Static Drain-Source On-Resistance RDS(on) VGS = 10V, ID = 4.5A — 0.68 0.80 Ω
Diodes Forward Voltage VSD IS = 9.0A, VGS = 0V — — 1.4 V
Dynamic Characteristics (8)
Parameter Symbol Test Condition Min Typ Max Units
Input Capacitance Ciss — 1135 — pF
Output Capacitance Coss VDS = 25V, VGS = 0V, f = 1.0MHz — 110 — pF
Reverse Transfer Capacitance Crss — 12 — pF
Switching Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Turn-On Delay Time td(on) — 18 — ns
Rise Time tr VDS = 6...10V, VGS = 400V — 36 — ns
Turn-Off Delay Time td(off) ID = 9.0A, RGEN = 25Ω — 70 — ns
Fall Time tf — 30 — ns
Gate Charge Characteristics (7)
Parameter Symbol Test Condition Min Typ Max Units
Total Gate Charge (VGS = 10V) Qg — 23 — nC
Gate-Source Charge Qgs VDS = 250V, ID = 9.0A — 7.0 — nC
Gate-Drain Charge Qgd — 7.0 — nC
Drain-Source Diode Characteristics (6)
Parameter Symbol Test Condition Min Typ Max Units
Body Diode Recovery Time trr — 276 — ns
Body Diode Reverse Recovery Charge Qrr VDD = 400V, VGS = 10V — 2.9 — µC
Body Diode Reverse Recovery Current IRM IS = 9.0A, di/dt = 100A/ns — 21 — A
Diode Forward Current IS TJ = 25°C — — 9.0 A

Notes:

  1. This current is chip limited, which is calculated based on Rθjc.
  2. This current is calculated on single pulse with 10µs Pulse & Duty Cycle = 1%.
  3. Defined by design; not subject to production test. EAS condition: TJ=25°C, VDD=50V, VGS=10V, L=10mH, IAS=9A.
  4. Device mounted on FR4 substrate PC board with 2oz copper on 1inch square cooling area.
  5. Thermal resistance from junction to soldering point (on the exposed drain pad).
  6. Short duration pulse test used to minimize self-heating effect.
  7. Defined by design, not subject to production.
  8. Coss is a fixed capacitance that gives the same stored energy as Coss while VDS is rising from 0 to 480V.
  9. Coss is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 480V.